ESD protection for RF/AMS ICs: Design and optimization

Wang, X.; Tang, He; Lin, Lehang; Fang, Qiang; Zhao, Hui; Wang, Albert; Zhang, G.; Zhou, Yunyan; Yang, Liquan; Chen, H.

doi:10.1109/icicdt.2009.5166257

Cited by 8 publications

(1 citation statement)

References 11 publications

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“…1, a complete fullchip ESD protection scheme requires multiple ESD devices per pad to discharge ESD surges with different polarities, i.e., positive from I/O to V SS (PS), negative from I/O to V SS (NS), positive from I/O to V DD (PD), negative from I/O to V DD (ND), positive from V DD to V SS (DS) and positive from V SS to V DD (SD). There are several ESD design challenges [6][7][8]. The first one is ESD design optimization and prediction, which requires comprehensive mixed-mode ESD simulation to address the complex coupling effects among electrothermal, process, device, circuit and layout.…”

Section: Introductionmentioning

confidence: 99%

ESD protection and biomedical integrated circuit co-design techniques

Liu

Wang

Zhao

et al. 2011

2011 IEEE Biomedical Circuits and Systems Conference (BioCAS)

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This paper reviews new design techniques for electrostatic discharge (ESD) and biomedical integrated circuit (IC) co-designs (ESD-Biomed co-design) for whole-chip design optimization. Challenges for ESD protection design for biomedical electronics are discussed. Promising ESD protection structures for biomedical ICs are described. Example of ESDprotected ultrasound medical imaging system is presented.

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Section: Introductionmentioning

confidence: 99%