ESD Susceptibility of Thick Film Chip Resistors by Means of Transmission Line Pulsing

Bonfert, Detlef; Wolf, Heinrich; Gieser, H.; Stocker, Alexander

doi:10.1109/estc.2006.280125

Cited by 10 publications

(6 citation statements)

References 12 publications

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“…During the TLP measurement the pulse amplitude was stepwise increased, as shown in figure 6. The resistors voltage and current transients were recorded for each pulse, leading to the pulsed I/V-characteristic of the DUT.…”

Section: Test Setupmentioning

confidence: 99%

See 1 more Smart Citation

Transmission Line Pulse Stress on Thick Film Resistors

Bonfert

Wolf

Gieser

et al. 2007

2007 30th International Spring Seminar on Electronics Technology (ISSE)

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One of the most important issues of resistors properties is the value stability under different electrical and non electrical influences. Mechanical andlor thermal stress together with the electrical one represents the main factors that have a major contribution in resistor value stability. With shrinking resistor geometries of discrete, integrated and integral passives, the electrical stress gains more and more importance, especially under short duration voltage pulses. The analytical test technique of Transmission Line Pulsers (TLP) allows, on the basis of square pulses, the in-situ monitoring of the voltages and currents at the DUT during pulsing and helps to gain fundamental insights into the electrical behavior. The influence of the pulse width and height on the current-voltage behavior was investigated on thickfilm chip resistors of different values and sizes. The resistance change due to an applied high voltage pulse is a measure of the Electro Static Discharge (ESD) susceptibility ofthickfilm resistors.

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Section: Test Setupmentioning

confidence: 99%

“…In [6] and [7] the authors made a first introduction to the TLP-measurement technique on thick and thin film resistors. In this work the analysis of thick film resistors is extended from single to multiple pulsing, showing the behavior before, during and after pulsing.…”

Section: Introductionmentioning

confidence: 99%

Transmission Line Pulse Stress on Thick Film Resistors

Bonfert

Wolf

Gieser

et al. 2007

2007 30th International Spring Seminar on Electronics Technology (ISSE)

Self Cite

View full text Add to dashboard Cite

show abstract

“…In [6] - [8] the authors made an introduction to the TLP-measurement technique on thick-and thin film resistors. In this work the analysis is made comparing thick-and thin-film resistors on different, rigid and flexible substrates, with single and multiple pulsing, showing the common behavior before, during and after pulsing.…”

Section: Introductionmentioning

confidence: 99%

Electrical stress on film resistive structures on different substrates

Bonfert

Klink

Bock

et al. 2011

Proceedings of the 2011 34th International Spring Seminar on Electronics Technology (ISSE)

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One of the most important issues of resistors properties is the value stability under different electrical and non electrical influences. Mechanical and/or thermal stress together with the electrical one represent the main factors that have a major contribution in resistor value stability. With highly isolating and/or flexible substrates the devices become also susceptible to electrical stress, like for example Electro Static Discharge (ESD). In order to investigate the behavior at high current densities, a pulsed measurement technique was applied to the film resistive structures on different substrates. The analytical test technique of Transmission Line Pulsers (TLP) allows, on the basis of square pulses, the in-situ monitoring of the voltages and currents at the Device Under Test (DUT) during pulsing and helps to gain fundamental insights into the electrical behavior at higher current densities. In this work the analysis is made comparing thick- and thin- film resisto rs on different, rigid and flexible substrates, with single and multiple pulsing, showing the common behavior before, during and after pulsing

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“…In [7] - [10] the authors made an introduction to the TLP-measurement technique on thick and thin film resistors. In this work the analysis is made on carbon based thick film resistors on flexible substrates, like polyimide (Kapton), with single and multiple pulsing, showing the behavior before, during and after pulsing.…”

Section: Introductionmentioning

confidence: 99%