1977
DOI: 10.6028/jres.082.004
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Establishing a scale of directional-hemispherical reflectance factor I: The Van den Akker method

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Cited by 38 publications
(21 citation statements)
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“…The reflectance scale for the reference standard was determined prior to the measurement sessions through comparison measurements of sintered PTFE and pressed PTFE. The spectral reflectance factors for sintered PTFE are traceable to the scale for spectral reflectance factor of pressed PTFE, which were established using the absolute method of Van den Akker [3] in the NIST Spectral Tri-function Automated Reference Reflectometer (STARR) facility [4].…”
Section: Calculation Of Reflectance Factorsmentioning
confidence: 99%
“…The reflectance scale for the reference standard was determined prior to the measurement sessions through comparison measurements of sintered PTFE and pressed PTFE. The spectral reflectance factors for sintered PTFE are traceable to the scale for spectral reflectance factor of pressed PTFE, which were established using the absolute method of Van den Akker [3] in the NIST Spectral Tri-function Automated Reference Reflectometer (STARR) facility [4].…”
Section: Calculation Of Reflectance Factorsmentioning
confidence: 99%
“…Ten years later, in 1966, they refined their work under the same title and gave more detailed information about their method and the apparatus [17]. The van den Akker, or double-sphere method, was used at the NBS in the United States to calibrate a standard reflectance material [35]. The setup of the method measures the bihemispherical reflectance r(2p, 2p) of this material.…”
Section: Methods Of Van Den Akkermentioning
confidence: 99%
“…A more complicated expression [35] is found when one includes the non-Lambertian behavior of the integrating sphere.…”
Section: Methods Of Van Den Akkermentioning
confidence: 99%
“…When the incident angle deviates from these values, the diffuse reflectance of the sphere coating changes [56], which affects the sphere response. The incident angle correction factor was measured by positioning the beam source at the center of the sphere, illuminating the hot spot, and measuring the sphere photometer response, y0(θe, φe).…”
Section: Incident Angle Correction Factormentioning
confidence: 99%