2015
DOI: 10.1021/acs.jpcc.5b04456
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Establishing Nanoscale Heterogeneity with Nanoscale Force Measurements

Abstract: Establishing the presence or absence of nanoscale compositional heterogeneity with nanoscale resolution is becoming instrumental for the development of many fields of science. Force versus distance measurements and parameters directly or indirectly derived from these profiles can be potentially employed for this purpose with sophisticated instruments such as the atomic force microscope (AFM). On the other hand, standards are necessary to reproducibly and conclusively support hypothesis from experimental data a… Show more

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Cited by 6 publications
(9 citation statements)
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“…While WCA quanties the water wettability of a surface on a macroscopic length scale, the force of adhesion |F adh | (the attractive maximum of the force prole) measured/simulated by AFM provides an alternative measure on a nanoscopic scale. [66][67][68][69][70][71][72][73] A relation between the two quantities is highly needed, since it enables the high-resolution characterization of wettability. For this purpose, we examine the correlation between WCA and |F adh |.…”
Section: Resultsmentioning
confidence: 99%
“…While WCA quanties the water wettability of a surface on a macroscopic length scale, the force of adhesion |F adh | (the attractive maximum of the force prole) measured/simulated by AFM provides an alternative measure on a nanoscopic scale. [66][67][68][69][70][71][72][73] A relation between the two quantities is highly needed, since it enables the high-resolution characterization of wettability. For this purpose, we examine the correlation between WCA and |F adh |.…”
Section: Resultsmentioning
confidence: 99%
“…The force reconstruction also consisted of 100 data points per sample and per experiment. We have previously demonstrated 43 that this results in robust mean and standard deviation values for this type of experiment including reproducibility and repeatability.…”
Section: ■ Methodsmentioning
confidence: 99%
“…Figure 5e shows the variation of the average FAD as a function of the exposure time. Since it is well known that the tip radius R significantly affects the interaction between the tip and the sample surface, R was monitored in situ throughout the experiment using the critical amplitude method 60 that accounts for the apparent changes in R. The progressively different and statistically significant average of multiple measurements provided evidence that the changes in FAD are not experimental artifacts 61 and that the absolute value of the adhesion force increases with exposure time (the negative sign is related to the attractive nature of the force). The surface energy γ calculated using Eq.…”
Section: Quantification Of the Photoinduced Changes Of Surface Propermentioning
confidence: 99%