2000
DOI: 10.1107/s0021889800010888
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Estimating nanoparticle size from diffraction measurements

Abstract: Nanometre-sized particles are of considerable current interest because of their special size-dependent physical properties. Debye±Scherrer diffraction patterns are often used to characterize samples, as well as to probe the structure of nanoparticles. Unfortunately, the well known`Scherrer formula' is unreliable at estimating particle size, because the assumption of an underlying crystal structure (translational symmetry) is often invalid. A simple approach is presented here which takes the Fourier transform o… Show more

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Cited by 228 publications
(128 citation statements)
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“…From this study, considering the peak at degree, average particle size has been estimated by using DebyeScherrer formula [13]- [15].…”
Section: Particle Size Calculationmentioning
confidence: 99%
“…From this study, considering the peak at degree, average particle size has been estimated by using DebyeScherrer formula [13]- [15].…”
Section: Particle Size Calculationmentioning
confidence: 99%
“…Up till now, the most popular techniques used to determine the size of NPs include electron microscopy -TEM and SEM [193,194], and DLS for particles in suspension [195], and small-angle X-ray scattering (SAXS) [196]. TEM is the most direct method since size measurements can be obtained from particle images.…”
Section: Sizementioning
confidence: 99%
“…The calculated values of crystallite sizes are listed in Table 3. The Fourier method has been also applied to the diffraction data of stabilized Cu NPs in order to calculate the relative size of stabilized Cu NPs, according to the described by Hall et al 24 FT P(r) was calculated using the Origin 8.0 v8.0724 software.…”
mentioning
confidence: 99%