2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) 2014
DOI: 10.1109/dft.2014.6962059
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Estimating the effect of single-event upsets on microprocessors

Cristian Constantinescu
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,
Srini Krishnamoorthy
2
,
Tuyen P. Nguyen
3
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