2014
DOI: 10.1016/j.mee.2014.04.039
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Estimation of pattern resolution using NaCl high-contrast developer by Monte Carlo simulation of electron beam lithography

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Cited by 2 publications
(2 citation statements)
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“…To fabricate NWs with different widths, the structure of the NWs was designed in various width scales (from 4 to 10 nm) using a computer design software (VectorWorks). The fabricated widths of HSQ NWs depend on the design width and are determined by the beam spot size, beam focusing techniques, and exposure dosages. , Therefore, design widths and exposure dosages using good beam focusing techniques were controlled to form NWs with different widths. To transfer HSQ NW patterns into the top Si layer of the SOI wafer, ICP-RIE was performed via CF 4 plasma etching.…”
Section: Methodsmentioning
confidence: 99%
“…To fabricate NWs with different widths, the structure of the NWs was designed in various width scales (from 4 to 10 nm) using a computer design software (VectorWorks). The fabricated widths of HSQ NWs depend on the design width and are determined by the beam spot size, beam focusing techniques, and exposure dosages. , Therefore, design widths and exposure dosages using good beam focusing techniques were controlled to form NWs with different widths. To transfer HSQ NW patterns into the top Si layer of the SOI wafer, ICP-RIE was performed via CF 4 plasma etching.…”
Section: Methodsmentioning
confidence: 99%
“…The EB writing system is a combination of a high-resolution scanning electron microscope (SEM) with a Schottky emission-type field-emission electron gun (JSM6500F, JEOL) and a drawing controller (Beam Draw, Tokyo Technology) . To form narrow nanowires with high-resolution, negative-tone resist hydrogen silsesquioxane (HSQ, Dow Corning) and a high-contrast salty development solution , were employed. Normally, a thin HSQ resist layer would be employed to form a high-resolution pattern because the EB scattering range (lateral) in a thin resist layer is smaller than that in a thick resist layer.…”
Section: Methodsmentioning
confidence: 99%