Estimation of plasma parameters of X-pinch with time-resolved x-ray spectroscopy

Abstract

We estimate the parameters of a Cu plasma generated by an X-pinch by comparing experimentally measured x-rays with synthetic data. A filtered absolute extreme ultraviolet diode array is used to measure time-resolved x-ray spectra with a spectral resolution of ∼1 keV in the energy range of 1–10 keV. The synthetic spectra of Cu plasmas with different electron temperatures, electron densities, and fast electron fractions are calculated using the FLYCHK code. For quantitative comparison with the measured spectrum, two x-ray power ratios with three different spectral ranges are calculated. We observe three x-ray bursts in X-pinch experiments with two Cu wires conducted on the SNU X-pinch at a current rise rate of ∼0.2 kA/ns. Analysis of the spectra reveals that the first burst comprises x-rays emitted by hot spots and electron beams, with characteristics similar to those observed in other X-pinches. The second and third bursts are both generated by long-lived electron beams formed after the neck structure has been completely depleted. In the second burst, the formation of the electron beam is accompanied by an increase in the electron density of the background plasma. Therefore, the long-lived electron beams generate the additional strong x-ray bursts while maintaining a plasma channel in the central region of the X-pinch. Moreover, they emit many hard x-rays (HXRs), enabling the SNU X-pinch to be used as an HXR source. This study confirms that the generation of long-lived electron beams is crucial to the dynamics of X-pinches and the generation of strong HXRs.

Development of a Collective Thomson Scattering diagnostic system on SNU X-pinch device

“…𝜔 𝑘 where, 𝜒 𝑒 is the electron susceptibilities, 𝜀 is the longitudinal dielectric function, and 𝑓 𝑒0 , 𝑓 𝑖0 are velocity distributions of each charge species, respectively. Also, Maxwell-Boltzmann distribution has been assumed for the plasma temperature [9,10]. When calculating expected signals with certain values within estimated variable range of the device, expected signals move in a narrow wavelength range as the plasma jet parameters change, as shown in figure 4.…”