Estimation of the reliability of digital systems implemented on programmable devices

Vasiltsov, I.V.; Mandziy, Bohdan

doi:10.1016/s0026-2714(00)00020-2

Cited by 7 publications

(3 citation statements)

References 0 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…It is clear that for automation of the design process the developer should have a powerful tools for verification the project at different level of designing. For establishing the approach proposed in [3] this problem can be solved by developing the mathematical models (MM), which allow simulating the noise distribution inside the chip. It is possible to use two approaches to developing the model of internal noises in the chip: computational and on the basis of analytic equations.…”

Section: Alexander Glushkomentioning

confidence: 99%

See 1 more Smart Citation

Software simulation of the noise distribution in the chip

Vasiltsov¹,

Mandzij²,

Bench³

et al.

IEEE International Symposium on Electromagnetic Compatibility

View full text Add to dashboard Cite

In this paper the problem of sofmare simulation of the noise distribution in the chip has been considered. On the basis of earlier developed analytical equations the internal electromagnetic noise distribution in the chip with orthogonal and complanar topology of power supply feeding have been obtained. These results can be useful to estimate the trends of the EM noise in the chip and evaluate the most critical area. Further, developer can change the placing of the functional modules in the chip to increase the stability of the designed device to internal noises.

show abstract

Section: Alexander Glushkomentioning

confidence: 99%

“…So nowadays great attention are paid for the alternative approaches, which allow to obtain the requested reliability level not on the hasis of huge redundancy techniques. In [3] authors proposed one of such approaches relatively devices implemented on matrix VLSI.…”

Section: Introductionmentioning

confidence: 99%

Software simulation of the noise distribution in the chip

Vasiltsov¹,

Mandzij²,

Bench³

et al.

IEEE International Symposium on Electromagnetic Compatibility

View full text Add to dashboard Cite

show abstract

“…Really, when developer would like to increase the reliability of the system according to external influences it is possible to use different shielding techniques. But the internal electromagnetic noises, caused by parasitic resistance, inductance and capacitance remain the main source of the incorrect functioning of the system [1], [2].…”

Section: Internal Noises In the Matrix Vlsi Chipmentioning

confidence: 99%

Approach to solve the reliability problem at packaging level in the matrix VLSI

Vasiltsov¹,

Mandziy²,

Bench³

2002 23rd International Conference on Microelectronics. Proceedings (Cat. No.02TH8595)

View full text Add to dashboard Cite

In this paper the problem of increasing the reliability of the designed devices, implemented on the matrix VLSI has been considered. The proposed approach consists in the choosing of the special area in the chip during mapping procedure at the packaging level. Using of such approach allows for designer to obtain more optimal topology solution, and thus will increase the reliability of designed devices.

show abstract

Frequency domain simulation of the EM internal noises in the matrix VLSI with orthogonal topology of power supply feeding

Vasiltsov

Mandziy

2002 3rd International Symposium on Electromagnetic Compatibility

View full text Add to dashboard Cite

Estimation of the reliability of digital systems implemented on programmable devices

Cited by 7 publications

References 0 publications

Software simulation of the noise distribution in the chip

Software simulation of the noise distribution in the chip

Approach to solve the reliability problem at packaging level in the matrix VLSI

Frequency domain simulation of the EM internal noises in the matrix VLSI with orthogonal topology of power supply feeding

Contact Info

Product

Resources

About