The dry etching of CoZrNb and CoTb magnetic thin films was carried out using Cl 2 and C 2 F 6 etch gases in an high density plasma. These new magnetic materials exhibited the etching characteristic of monotonous decrease in etch rate with increasing gas concentration. The etch rates of CoZrNb and CoTb films were faster in Cl 2 gas than in C 2 F 6 gas. The etch rates of CoZrNb and CoTb films were in the range of 30 ~ 60 nm/min for Cl 2 gas while in the case of C 2 F 6 gas, CoZrNb and CoTb films showed the etch rate of less than 20 nm/min. The etch profiles of CoZrNb and CoTb films exhibited clean without any etch residues but the etch slopes were shallow. As the concentration of Cl 2 gas increases, the etch slope became slanted. At the etch conditions used in this study, it is thought that the concentration of 20 ~ 40% Cl 2 /Ar gas is optimum to give fast etching and clean profiles.