2022
DOI: 10.1016/j.solmat.2021.111531
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Etching methods for texturing industrial multi-crystalline silicon wafers: A comprehensive review

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Cited by 33 publications
(21 citation statements)
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“…Whilst this methodology is not as low cost as the maskless RIE due to the need for patterning, previous works have demonstrated the effectiveness of this method in the fabrication of black silicon with good surface quality. 71,72 Hence, it is worth mentioning that for the masked-RIE, the choice of both the mask and the patterning technique plays a major role in the pattern transfer process. This section will thus be split into two parts in order to discuss the influence of the masking steps on the final structure profile.…”
Section: Masked and Mask-less Reactive Ion Etching (Rie)mentioning
confidence: 99%
“…Whilst this methodology is not as low cost as the maskless RIE due to the need for patterning, previous works have demonstrated the effectiveness of this method in the fabrication of black silicon with good surface quality. 71,72 Hence, it is worth mentioning that for the masked-RIE, the choice of both the mask and the patterning technique plays a major role in the pattern transfer process. This section will thus be split into two parts in order to discuss the influence of the masking steps on the final structure profile.…”
Section: Masked and Mask-less Reactive Ion Etching (Rie)mentioning
confidence: 99%
“…In addition, plasma-induced surface damage is unavoidable, especially since some surface defects inherent to the Bosch process (e.g., scalloped sidewalls), e.g., the scalloped depth of microscale width etched trenches, are typically up to 100 nm, which can severely degrade device performance [ 19 ]. On the other hand, the aspect ratio of etched trenches by anisotropic wet chemical etching methods (such as the KOH-based etching) is limited by the etching rate differences between different crystallographic orientations [ 20 , 21 ]. Although the accurate alignment of the lithographically defined mask to the crystalline plane is achieved, the aspect ratio is still limited at 80:1 [ 22 ].…”
Section: Introductionmentioning
confidence: 99%
“…[3] The acid texturing of DWS multicrystalline silicon (mc-Si) wafers is particularly challenging due to nonuniform saw damages. [2] Furthermore, the presence of an a-Si layer on the surface interferes with acid etch kinetics. [4] As a result, the acid texturing process on the DWS mc-Si wafers produces a nonuniform texture, resulting in an optical loss.…”
Section: Introductionmentioning
confidence: 99%
“…[4] As a result, the acid texturing process on the DWS mc-Si wafers produces a nonuniform texture, resulting in an optical loss. [2] To address these limitations, several alternative texturing methods for the mc-Si wafers have been investigated. Currently, two main methods are used in production: dry and wet texturing.…”
Section: Introductionmentioning
confidence: 99%
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