We show a scene containing a number of different microfacet conductors under direct lighting. All microfacets feature multiple scattering and use the GGX distribution with varying roughnesses (α ∈ [0.05, 0.5]). Compared to the baseline method of Dupuy et al. [DHd16] (left), our position-free bidirectional estimator of multiple scattering (right) leads to reduced variance at equal cost.