2019
DOI: 10.33079/jomm.19020202
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EUV Lithography: State-of-the-Art Review

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Cited by 52 publications
(35 citation statements)
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“…To produce NW arrays, top-down technologies use nanofabrication including lithography, etching, cleaning, passivation, functionalization, and metallization. The lithography technique is presented by photolithography [51][52][53], E-beam lithography [47,48,54,55], deep UV (DUV) nanoimprint lithography [53,56], and side-wall transfer lithography (STL) process [57,58]. In the following sections a survey of lithography, etching techniques, and also an investigation of contact resistance for the formation of NWs are presented.…”
Section: Fabrication Of Sinwsmentioning
confidence: 99%
See 1 more Smart Citation
“…To produce NW arrays, top-down technologies use nanofabrication including lithography, etching, cleaning, passivation, functionalization, and metallization. The lithography technique is presented by photolithography [51][52][53], E-beam lithography [47,48,54,55], deep UV (DUV) nanoimprint lithography [53,56], and side-wall transfer lithography (STL) process [57,58]. In the following sections a survey of lithography, etching techniques, and also an investigation of contact resistance for the formation of NWs are presented.…”
Section: Fabrication Of Sinwsmentioning
confidence: 99%
“…In order to resolve lines (half-pitch) smaller than 7 nm, the technology had to push the exposure wavelength to the limit which is extreme ultraviolet light with a wavelength of 13.5 nm [52]. With the help of Extreme Ultraviolet (EUV) lithography system, semiconductor technology can be impelled further to beyond 3 nm and Moore's law can be extended to more decades in the future.…”
Section: Lithography Photolithographymentioning
confidence: 99%
“…Nano-scale structures are traditionally defined using lithographic techniques such as UV lithography (1), electron beam lithography (2) and nano-imprint lithography (3). A cost-effective alternative to these traditional lithography methods could be to use nanoporous alumina as templates for ordered arrays of nanodots or nanowires (4,5).…”
Section: Introductionmentioning
confidence: 99%
“…The lattice strain in-and out-of-plane (along and across the nanowires) was calculated from the position of the Pd(111) reflection since it is the most intense reflection. The lattice parameter of bulk Pd, a=3.89Å, was used as a reference to calculate the lattice strain, , as shown in equation (1). An illustration of the orientation of the lattice planes probed in the nanowires during out-of-plane and in-plane diffraction is shown in Figure 4 (a).…”
Section: Resultsmentioning
confidence: 99%