Evaluating and expressing uncertainty in high-frequency electromagnetic measurements: a selective review

Ridler, N M; Salter, M J

doi:10.1088/0026-1394/51/4/s191

Cited by 11 publications

(17 citation statements)

References 9 publications

(15 reference statements)

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“…This method is often used for dealing with uncertainties in complex-valued measurements and is explained in more detail in [36]. A more detailed treatment of the uncertainty in the S-parameters can be obtained by applying the techniques given in [37] and [38].…”

Section: S-parameter Measurementsmentioning

confidence: 99%

Characterization of Dielectric Materials at WR-15 Band (50–75 GHz) Using VNA-Based Technique

Wang

Shang

Ridler

et al. 2020

IEEE Trans. Instrum. Meas.

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This article presents an in-depth study of a new vector network analyzer (VNA)-based electromagnetic material measurement method relying on a commercially available material characterization kit (MCK). These MCKs provide effectively a guided free-space technique with less stringent requirement on alignment compared with conventional free-space techniques. Coupled with time gating, these MCKs employ a simple calibration, composed of reflect and thru standards only, prior to taking reflection and transmission S-parameter measurements. This MCK-based method complements other conventional measurement techniques, e.g., time-domain spectroscopy (TDS) and resonant cavity, allowing fast broadband dielectric material characterization over the millimeter-and submillimeter-wave frequency ranges. In this article, a WR-15 (50-75 GHz) MCK is utilized for the measurements of S-parameters for seven types of low-loss dielectric material. Their dielectric constant and loss tangent are extracted from S-parameters and are compared against literature values. A relatively good agreement is achieved. Moreover, an investigation into the uncertainties of the extracted dielectric constant and loss tangent is performed and reported.

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Section: S-parameter Measurementsmentioning

confidence: 99%

Characterization of Dielectric Materials at WR-15 Band (50–75 GHz) Using VNA-Based Technique

Wang

Shang

Ridler

et al. 2020

IEEE Trans. Instrum. Meas.

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“…PIMMS uses a VNA in conjunction with a TRL calibration for which the required standards are a length (typically, a ¼ wavelength) of precision transmission line/waveguide and a short-circuit. PIMMS also evaluates the uncertainties in the S-parameter measurements, following international recommendations [23] that have been adapted to account for the fact that S-parameters are complex-valued quantities [28,29]. PIMMS evaluates the uncertainty by considering both prior knowledge and information gathered during the measurement process used to collect data for the DUTs.…”

Section: National Standard Comparisonmentioning

confidence: 99%

3-D printed primary standards for calibration of microwave network analysers

et al. 2020

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This paper describes the design, fabrication and testing of 3-D printed primary standards for use with the calibration of microwave vector network analysers. The standards are a short-circuit and a quarter wavelength section of line that are designed for use with the Thru-Reflect-Line calibration technique. The standards are realised in metal-pipe rectangular waveguide, covering the frequency range from 12 GHz to 18 GHz (i.e., Ku-band). The standards are polymer-based 3-D printed, which is subsequently metal plated to provide the required electrical conductivity. The performance of the standards is compared with conventionally machined standards that are used as part of the UK's primary national measurement system for microwave scattering parameters. The authors believe that this is the first time that 3-D printing techniques have been used to produce such calibration standards, and, that this could lead to a new approach to providing metrological traceability for these types of measurement.

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“…̅̅̅̅ is taken as the result of the measurement and ( ̅̅̅̅ ) is taken as the component of measurement uncertainty due to random errors. A more detailed treatment of the uncertainty in the S-parameters can be obtained by applying the techniques given in [17,18]. The process of undertaking these repeated connections also exposes another source of uncertainty namely, errors due to the flexing of the cables that connect between the VNA front panel and the frequency-multiplier Extender Heads, as shown in Fig.…”

Section: Measurement Uncertaintiesmentioning

confidence: 99%