2023
DOI: 10.3390/solids4040018
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Evaluating Phonon Characteristics by Varying the Layer and Interfacial Thickness in Novel Carbon-Based Strained-Layer Superlattices

Devki N. Talwar,
Piotr Becla

Abstract: Systematic results of lattice dynamical calculations are reported as a function of m and n for the novel (SiC)m/(GeC)n superlattices (SLs) by exploiting a modified linear-chain model and a realistic rigid-ion model (RIM). A bond polarizability method is employed to simulate the Raman intensity profiles (RIPs) for both the ideal and graded (SiC)10-Δ/(Si0.5Ge0.5C)Δ/(GeC)10-Δ/(Si0.5Ge0.5C)Δ SLs. We have adopted a virtual-crystal approximation for describing the interfacial layer thickness, Δ (≡0, 1, 2, and 3 mono… Show more

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Cited by 1 publication
(2 citation statements)
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“…In the lack of such data for novel C-based (XC)m/(YC)n SLs, it is necessary to simulate Raman intensity profiles. Although the lattice dynamical calculations are known for the bulk SiC, GeC, and SnC materials [146,154], there exist either limited [153] or no reports for comprehending the phonon dispersions ω (q ⃗) of their SLs. To understand the impact of interfacial layer thickness on ω (q ⃗) as well as on Raman spectra, we presented here our systematic results for both the ideal (XC)m/(YC)n and graded (XC) ∆ /(X .…”
Section: Raman Intensity Profiles In Ideal Superlatticesmentioning
confidence: 99%
See 1 more Smart Citation
“…In the lack of such data for novel C-based (XC)m/(YC)n SLs, it is necessary to simulate Raman intensity profiles. Although the lattice dynamical calculations are known for the bulk SiC, GeC, and SnC materials [146,154], there exist either limited [153] or no reports for comprehending the phonon dispersions ω (q ⃗) of their SLs. To understand the impact of interfacial layer thickness on ω (q ⃗) as well as on Raman spectra, we presented here our systematic results for both the ideal (XC)m/(YC)n and graded (XC) ∆ /(X .…”
Section: Raman Intensity Profiles In Ideal Superlatticesmentioning
confidence: 99%
“…From a theoretical standpoint, several calculations of phonon dispersions for bulk XC materials have been performed using the full potential linear augmented plane wave (FP-LAPW), first principles (ab-initio), molecular dynamics, and phenomenological methods [103][104][105][106][107][108][109][110][111][112][113][114][115][116][117][118][119]146]-some of these studies provided atypical results. Except for a preliminary report [153], no methodological studies are available on the phonon dispersions ω q ⃗ of novel strained layer XC /(YC) SLs, especially for comprehending the prospects of FAPs, COMs, and IPMs. Due to the large lattice mismatch between SiC-GeC (~5.0%), GeC-SnC (~10.5%), and SiC-SnC (~15.0%) [154], one would expect stress in the planes parallel and perpendicular to the SL interfaces.…”
Section: Introductionmentioning
confidence: 99%