2014 24th International Workshop on Power and Timing Modeling, Optimization and Simulation (PATMOS) 2014
DOI: 10.1109/patmos.2014.6951859
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Evaluating the impact of environment and physical variability on the I<inf>ON</inf> current of 20nm FinFET devices

Alexandra L. Zimpeck
1
,
Cristina Meinhardt
2
,
Ricardo Reis
3
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Cited by 5 publications
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Reliability Challenges in FinFETs

Zimpeck
1
,
Meinhardt
2
,
Artola
3
et al. 2021
Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs
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Reliability Challenges in FinFETs

Zimpeck
1
,
Meinhardt
2
,
Artola
3
et al. 2021
Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs
2
0
0
0
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Fast and Low-Error Prediction of Logic Gate Cell Characterization

Jacinto,
Schneider,
Zimpeck
et al. 2023
2023 30th IEEE International Conference on Electronics, Circuits and Systems (ICECS)
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Using Lyapunov Exponents to Estimate Sensitivity to Process Variability

Ramos
1
,
Reis
2
2023
2023 IEEE 14th Latin America Symposium on Circuits and Systems (LASCAS)
2
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