Evaluation and analytical electron microscopy investigation of a plated aluminum wire for branch circuit applications

Aronstein, J.; Hare, Tony

doi:10.1109/33.2990

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2005

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Cited by 3 publications

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Data is presented for temperature and humidity inside various electrical enclosures in residential structures. Conditions within the enclosures are seen to be harsh relative to the indoor ambient that is used for standard qualification tests. There are large temperature excursions and sustained periods of high humidity. Based on the long-term data, a method is presented for estimating the temperature and humidity extremes that are encountered by connections in a representative cross section of residential wiring system applications.

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AC and DC electromigration failure of aluminum contact junctions

Aronstein

Hare

2005

IEEE Trans. Comp. Packag. Technol.

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Current flow across a typical aluminum contact interface occurs only where metallic junctions form at cracks in the insulating aluminum oxide. When the total metallic conducting area is small, current density may be high enough to initiate electromigration failure. These experiments use a solid aluminum specimen having a constricted current path, representing a single metallic contact junction. Specimens are tested with alternating or direct current flow at current density up to 10 6 A/cm 2 . Electromigration failure, observed as a relatively abrupt increase of resistance, occurs in both ac and dc specimens. Electron microscope examination indicates that the deterioration is due to electromigration. Conditions under which electromigration deterioration may occur in practical aluminum power connections are discussed. A method is provided for estimating the minimum possible current density in aluminum connections. The implications for the theory of aluminum contact behavior and the practical considerations of effective life testing are discussed.

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Evaluation and analytical electron microscopy investigation of a plated aluminum wire for branch circuit applications

Cited by 3 publications

References 4 publications

AC and DC electromigration in aluminum

AC and DC electromigration in aluminum

Environmental conditions of residential electrical connections

AC and DC electromigration failure of aluminum contact junctions

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