Evaluation of dynamics of charge accumulation and dissipation processes in Ge15Se85 thin film under electron beam irradiation by mapping surface potential distribution

Bilanych, V.S.; Shylenko, O.; Vorobiov, S.; Soroka, S.; Bilanych, V.V.; Rizak, V.; Lytvyn, P.M.; Loya, V. Yu; Feher, A.; Komanicky, V.

doi:10.1016/j.tsf.2023.140162

Thin Solid Films

2024

DOI: 10.1016/j.tsf.2023.140162

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Evaluation of dynamics of charge accumulation and dissipation processes in Ge15Se85 thin film under electron beam irradiation by mapping surface potential distribution

V.S. Bilanych,

O. Shylenko,

S. Vorobiov

et al.

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2024

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Cited by 1 publication

References 29 publications

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Reduction of SEM charging artefacts in native cryogenic biological samples

Velazco,

Glen,

Klumpe

et al. 2024

Preprint

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Scanning electron microscopy (SEM) of frozen-hydrated biological samples allows imaging of subcellular structures at the mesoscale in their native state. Combined with focused ion beam milling (FIB), serial FIB/SEM can be used to build a 3-dimensional picture of cells and tissues. The correlation of specific regions of interest with cryo-electron microscopy (cryoEM) can additionally enable subsequent high-resolution analysis. However, the adoption of serial FIB/SEM imaging-based methods is limited due to artefacts arising from insulating areas of cryogenically preserved samples. Here, we demonstrate the use of interleaved scanning to reduce charging artefacts, allowing the observation of biological features that otherwise would be masked or perturbed. We apply our method to samples where inherent features are not visible. These examples include membrane contact sites within mammalian cells, visualisation of the degradation compartment in the algae E.gracilis and observation of a network of membranes within different types of axons in an adult mouse cortex. We further propose an alternative scanning method that could also be widely applicable to imaging any non-conductive.

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Reduction of SEM charging artefacts in native cryogenic biological samples

Velazco,

Glen,

Klumpe

et al. 2024

Preprint

View full text Add to dashboard Cite

show abstract

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Evaluation of dynamics of charge accumulation and dissipation processes in Ge15Se85 thin film under electron beam irradiation by mapping surface potential distribution

Cited by 1 publication

References 29 publications

Reduction of SEM charging artefacts in native cryogenic biological samples

Reduction of SEM charging artefacts in native cryogenic biological samples

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