2017
DOI: 10.1016/j.nucet.2017.08.007
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Evaluation of effective threshold displacement energies and other data required for the calculation of advanced atomic displacement cross-sections

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Cited by 236 publications
(69 citation statements)
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“…Prior to these calculations, the SRIM code [35] was used to calculate the energy and angular direction of the nascent particle flux (Hf sputtered atoms) leaving the target. A displacement energy threshold of 61 eV was chosen for Hf [36] and the SRIM output file was used as the input parameter in the SIMTRA code. These simulations give us access to a set of useful information, such as angular distribution, number of particles arriving at the surface of the substrate, as well as average energy of particles arriving at the surface of the substrate.…”
Section: Characterization Methodsmentioning
confidence: 99%
“…Prior to these calculations, the SRIM code [35] was used to calculate the energy and angular direction of the nascent particle flux (Hf sputtered atoms) leaving the target. A displacement energy threshold of 61 eV was chosen for Hf [36] and the SRIM output file was used as the input parameter in the SIMTRA code. These simulations give us access to a set of useful information, such as angular distribution, number of particles arriving at the surface of the substrate, as well as average energy of particles arriving at the surface of the substrate.…”
Section: Characterization Methodsmentioning
confidence: 99%
“…For Fe, Ni, Cu, Pd, Ag, W, Pt, and Au the parameters included in the arc-dpa formalism were taken from Refs. [309,310,314] and for other materials were estimated using a semi-empirical systematic approach [315]. The approach uses the correlations between minimum, averaged, and effective threshold displacement energies and a number of quantities such as melting temperature, material density, cohesive energy, and others.…”
Section: Displacement Damage Datamentioning
confidence: 99%
“…For example, the ratio for α~3 00K (1.53)/ α~3 00K (1.7) as energy decreases from 1.7 to 1. 53 [18], respectively. Below the absorption edge, for 1.2 ≤ E(eV) ≤ 1.6, the A0d_rf-f0 reference layer absorption coefficient slowly decreases with decreasing energy towards mid-gap and, as seen above, its values remain quite high compared to those in the higher energy range above the absorption edge.…”
Section: Discussionmentioning
confidence: 99%
“…As well documented since decades (for example, see references in [50][51][52]), the energy transfer from the beam electrons to the target occurs via elastic collisions with target nuclei, and, via inelastic collisions with target electrons. The elastic collisions generate vacancyinterstitials pairs via replacement collision sequences along the crystalline directions with lower threshold energy displacements [53]. The inelastic ones generate electronic excitation or secondary electrons via ionization.…”
Section: Continuous Illumination In the Ajd_fn Layersmentioning
confidence: 99%