2005
DOI: 10.1029/2005ja011062
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Evaluation of electron impact excitation of N2 X 1Σg+(0) into the N2+ X 2Σg+(v), A 2Πu(v), and B 2Σu+(v) states

Abstract: Published experimental integrated electric dipole photoionization oscillator strengths (fij) have been applied to the determination of absolute electron impact excitation cross sections of the N2 X 1Σg+(0) state into the N2+ X 2Σg+(v), A 2Πu(v), and B 2Σu+(v) states. The required relative electron impact cross section shape functions from threshold to energy values, limited by the imposition of relativistic effects at the high end, are established in this work by extracting accurate analytic functions from a c… Show more

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Cited by 27 publications
(28 citation statements)
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References 108 publications
(329 reference statements)
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“…The best agreement between the experimental data and calculated intensity is obtained by using cross sections from Shemansky and Liu (2005) together with spectroscopic parameters from Gilmore et al (1992). Comparison between the measured intensity of 427.8 nm emissions and the modeled emission using cross sections from Shemansky and Liu (2005), Van Zyl and Pendleton (1995) and Doering and Yang (1997).…”
Section: Comparison Of Optical Data From Alis and Particle Data From mentioning
confidence: 97%
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“…The best agreement between the experimental data and calculated intensity is obtained by using cross sections from Shemansky and Liu (2005) together with spectroscopic parameters from Gilmore et al (1992). Comparison between the measured intensity of 427.8 nm emissions and the modeled emission using cross sections from Shemansky and Liu (2005), Van Zyl and Pendleton (1995) and Doering and Yang (1997).…”
Section: Comparison Of Optical Data From Alis and Particle Data From mentioning
confidence: 97%
“…The simultaneous measurements of the 427.8 nm emission by ALIS and Reimei imagers show excellent agreement, indicating that the calibration of the two instruments is correct. Comparison of the 427.8 nm emission intensity calculated using the incident electron flux measured by the Reimei particle instruments with intensities measured by the optical imagers show that the best match is reached with the cross section from Shemansky and Liu (2005). …”
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confidence: 92%
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