2018
DOI: 10.1016/j.apsusc.2017.10.106
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Evaluation of nanoindentation load-depth curve of MEMS bridge structures by calculating the critical elastic-plastic bending deflections

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Cited by 8 publications
(2 citation statements)
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“…However, the main limitations of this technique are the indentation depth, complex distribution of the indentation induced stresses and relatively costly experimental setup. Generally, FEM (finite element method) based simulations and analytical models are used to study the experimental load versus indentation depth curve and corresponding elastic-plastic stress distribution in thin films [30][31][32][33][34][35][36][37][38]. In addition to static tests, non-destructive dynamic tests based on the resonance frequency have also be implemented to evaluate the elastic behavior and residual stress in the thin films [39][40][41].…”
Section: Introductionmentioning
confidence: 99%
“…However, the main limitations of this technique are the indentation depth, complex distribution of the indentation induced stresses and relatively costly experimental setup. Generally, FEM (finite element method) based simulations and analytical models are used to study the experimental load versus indentation depth curve and corresponding elastic-plastic stress distribution in thin films [30][31][32][33][34][35][36][37][38]. In addition to static tests, non-destructive dynamic tests based on the resonance frequency have also be implemented to evaluate the elastic behavior and residual stress in the thin films [39][40][41].…”
Section: Introductionmentioning
confidence: 99%
“…They are widely used in medicine, military fields, and our daily life [1][2][3]. They have high requirements in parts, not only small size but also complex microstructures [4,5]. Microarrays play an important role in many key components [6,7].…”
Section: Introductionmentioning
confidence: 99%