19th International Conference on VLSI Design Held Jointly With 5th International Conference on Embedded Systems Design (VLSID'0 2006
DOI: 10.1109/vlsid.2006.85
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Evaluation of non-quasi-static effects during SEU in deep-submicron MOS devices and circuits

Pooja Jain
1
,
Dharmendra Kumar
2
,
J. Vasi
3
et al.

Abstract: Abstract

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