Evaluation of reliability and characteristics measure using exponential decay distribution of non‐series parallel network

Abstract

The purpose of this paper is to analyze the reliability and characteristics of the non‐series‐parallel network. The illustrative non‐series parallel networks, that is, the Twin T‐Network and the network with six components of resistor and capacitor, have been converted into a series of parallel network combinations by use of the minimal path technique. The stochastic variables related to component failure rate have been demonstrated using exponential decay distribution. We obtain the reliability, mean time to failure, and sensitivity with the use of the exponential decay distribution. The reliability and its attributes are examined by assuming different values of scale and shape parameters at different points of time. Using Owen's methodology, we obtained minimal signature, tail signature, expected time, expected cost, and Barlow‐Proschan index were determined. The performance of all reliability characteristics has been observed graphically for arbitrary values of parameters. A real‐world example is used to introduce the point.