2012
DOI: 10.1016/j.matchar.2012.07.017
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Evaluation of strain caused by coherent precipitates in an Al alloy using TEM techniques

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Cited by 8 publications
(4 citation statements)
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“…Aluminum alloy precipitates which are only in nanometer range of diameter have established lattice-strains at precipitates-matrix interfaces due to the differences in lattice parameter value [9]. These lattice-strains caused distortion on crystal lattice structure which then prevent the dislocation motion of plane and consequently increase the alloy strength and hardness.…”
Section: Resultsmentioning
confidence: 99%
“…Aluminum alloy precipitates which are only in nanometer range of diameter have established lattice-strains at precipitates-matrix interfaces due to the differences in lattice parameter value [9]. These lattice-strains caused distortion on crystal lattice structure which then prevent the dislocation motion of plane and consequently increase the alloy strength and hardness.…”
Section: Resultsmentioning
confidence: 99%
“…The techniques for the quantitative evaluation of the displacement of atoms and related elastic strain developed by Hÿtch [203,204] and Galindo [205] provided remarkable progress in understanding the strain distribution in the microstructure, especially on the atomic scale. Thus far, there have been many reports on the characterization of elastic strain not only at the grain boundaries as twins [206] and dislocations at the grain boundaries [207][208][209] but also at the interphase boundary in the device [210], heterointerface at an epitaxially grown superlattice [211], and precipitate/matrix interfaces [212][213][214][215][216]. In addition to the strain (stress) field evaluated by the precise measurement of the displacement of atoms, the differential phase-contrast (DPC) imaging by a segmented detector [217] spread a new era in the visualization of electric [218,219] and magnetic fields [220] on an atomic scale.…”
Section: Prospects Of the Quantitative Characterization Of Interface ...mentioning
confidence: 99%
“…Lower-resolution strain maps can be obtained by e.g. dark field imaging [12], dark-field holography [11] or (convergent) electron beam diffraction [13]. But hope is not lost for ADF-STEM: A methodology based on multi-frame exposures and alignment of the scan rows in each frame has proven to increase the positional accuracy up to the level of conventional TEM [14], without suffering effects such as uneven focus and contrast reversal.…”
Section: Introductionmentioning
confidence: 99%
“…Unfortunately, this otherwise superb imaging technique is plagued by scan distortions related to probe flyback, specimen drift, electronic noise and other environmental effects [8,9]. Accurate atomic positions are required for high-resolution strain measurements, and experimenters therefore typically resort to conventional high-resolution TEM imaging [10,11] or only measuring strain along the fast-scan direction in a STEM image when high precision is required. Lower-resolution strain maps can be obtained by e.g.…”
mentioning
confidence: 99%