2023 IEEE International Integrated Reliability Workshop (IIRW) 2023
DOI: 10.1109/iirw59383.2023.10477692
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Evaluation of Temperature-Humidity-Reverse Bias Robustness of 3rd Generation 650V Class 4H-SiC Discrete Power MOSFET Devices

Muhammad Waseem,
Mesfin Seid Ibrahim,
Waseem Abbas
et al.
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