2013
DOI: 10.1109/tdei.2013.6633701
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Evaluation of the performance of several object types for electrical treeing experiments

Abstract: A comparison of the efficiency between various test object types for studying the development of electrical trees in polymers is presented. Two types of newly developed wire-plane objects are investigated and compared with two versions of the traditionally used needle-needle object. The two needle-needle objects are prepared according to ASTM standard and act as references, whereas the alternative objects rely on the use of an ultra-thin tungsten wire (10 and 20 µm) for providing the highly divergent electric … Show more

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Cited by 29 publications
(13 citation statements)
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“…[ 30 ] A typical test sample containing a tungsten wire electrode is shown in Figure 2 a formation can be treated as a stochastic process, which requires a thorough statistical analysis in order to be able to compare the dielectric strength of different materials. As recommended by several industry standards, the data were fi tted to a Weibull distribution.…”
Section: Communicationmentioning
confidence: 99%
“…[ 30 ] A typical test sample containing a tungsten wire electrode is shown in Figure 2 a formation can be treated as a stochastic process, which requires a thorough statistical analysis in order to be able to compare the dielectric strength of different materials. As recommended by several industry standards, the data were fi tted to a Weibull distribution.…”
Section: Communicationmentioning
confidence: 99%
“…The diameter of tungsten wire (provided by Luma Metal, Sweden) is 10 μm. The manufacturing method of this type of treeing test object was earlier developed at Chalmers University of Technology [1].…”
Section: Manufacture Of Test Objectmentioning
confidence: 99%
“…These were of almost spherical shape with an average diameter of 45 nm. The test objects were prepared in form of the wire-plane electrode geometry [1]. The electrical treeing tests were carried out by applying 50 Hz AC voltage at a ramping speed of 22 V/s.…”
mentioning
confidence: 99%
“…Analysis of the recorded tree inception voltages [17] were carried out by means of extreme value Weibull statistics, according to the IEEE 930 guide [18]. The commonly used distribution for breakdown data analyses in solid dielectric materials is two-parameter Weibull distribution [19,20], for which the expression of the cumulative density function is defined as follows:…”
Section: Statisticsmentioning
confidence: 99%