2014
DOI: 10.1109/jsee.2014.00117
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Evidence for self-organized criticality in unscheduled downtime data of equipment

Abstract: How to reduce downtime and improve availability of the complex equipment is very important. Although the unscheduled downtime (USDT) issues of the equipment are very complex, the self-organized criticality (SOC) is the right theory to study complex systems evolution and opens up a new window to the investigation of disasters, such as the sudden failure of the equipment. Firstly, SOC theory and its validation method are introduced. Then an SOC validation method for USDT of the equipment is proposed based on the… Show more

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Cited by 2 publications
(3 citation statements)
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References 15 publications
(18 reference statements)
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“…Figure 1 shows the general semiconductor wafer fabrication process flow [16]. After wafer fabrication process, the wafers are sent for probe test to check the electrical distributions and yield, prior to sending to assembly and final test [7,[10][11][12][13][17][18][19][20]. One of the critical process in semiconductor wafer fabrication is the thermal oxidation process [6,8,9,11,12].…”
Section: Introductionmentioning
confidence: 99%
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“…Figure 1 shows the general semiconductor wafer fabrication process flow [16]. After wafer fabrication process, the wafers are sent for probe test to check the electrical distributions and yield, prior to sending to assembly and final test [7,[10][11][12][13][17][18][19][20]. One of the critical process in semiconductor wafer fabrication is the thermal oxidation process [6,8,9,11,12].…”
Section: Introductionmentioning
confidence: 99%
“…Maintaining the tool uptime has always been a test in the semiconductor manufacturing industry as industry gets more competitive by the day [17,20,[22][23][24][25]. Tool uptime is an important element towards the manufacturing production output [22].…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation