1983
DOI: 10.1039/f29837901075
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Evidence for semi-regularly ordered sequences of mirror and inversion symmetry planes in ZSM-5/ZSM-11 shape-selective zeolitic catalysts

Abstract: The combined use of high-resolution electron microscopic imaging, electron diffraction, optical diffraction and computer graphics for characterizing intergrowth structures of ZSM-5 and ZSM-11 is described. In particular, a specific preparation is shown to consist mainly of the ZSM-5 framework structure but with single insertions of strips of ZSM-11 at an average spacing of ca. 66 8, along [loo]. Evidence is also presented for the occurrence of an intergrowth in which one slab of ZSM-5 is related to an adjoinin… Show more

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Cited by 125 publications
(69 citation statements)
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“…[23][24][25][26] Intergrowths and defects arising due to stacking faults are of great importance as they can modify the pore dimensions and connectivity and have a large impact on applications. MFI-MEL and FAU-EMT are interesting systems for the investigation Abstract: This paper sets out to try to determine some of the nanoscopic details of template action in zeolites.…”
Section: Introductionmentioning
confidence: 99%
“…[23][24][25][26] Intergrowths and defects arising due to stacking faults are of great importance as they can modify the pore dimensions and connectivity and have a large impact on applications. MFI-MEL and FAU-EMT are interesting systems for the investigation Abstract: This paper sets out to try to determine some of the nanoscopic details of template action in zeolites.…”
Section: Introductionmentioning
confidence: 99%
“…In 1980s, significant TEM characterization work was done on large-sized MFI-type zeolite crystals, leading to imaging and electrondiffraction studies of its crystal structure, identification of defects and detection of MEL intergrowth within the MFI framework [1][2]. Since then, development of novel synthesis techniques has enabled the creation of 2-dimensional MFI nanosheets [3][4], while development of aberration corrected TEM has pushed the resolution limit of electron microscopes.…”
mentioning
confidence: 99%
“…[68] OberflĂ€chenstruktur kristallographischer (polytyper und anderer) Verwachsungen. [107,111] Neue Strukturtypen und KonnektivitĂ€ten bei mesoporösen Varianten (wie SB-2 und STAC-1) wurden von Zhou und seinen Mitarbeitern durch HREM identifiziert. [68,112] Fortschritte in der Detektortechnik (insbesondere bei CCDs (charge-coupled devices) und Bildplatten) erlauben heute die Aufnahme von HREM-Bildern mit einer weitaus geringeren Elektronendosis als bei Aufnahmen auf Film.…”
Section: Elektronenmikroskopieunclassified