2020
DOI: 10.1116/6.0000545
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Evidence of hydrogen termination at grain boundaries in ultrananocrystalline diamond/hydrogenated amorphous carbon composite thin films synthesized via coaxial arc plasma

Abstract: Ultranonocrystalline diamond / hydrogenated amorphous carbon composite thin films consist of three different components; ultrananocrystalline diamond crystallites, hydrogenated amorphous carbon, and grain boundaries between them. Since grain boundaries contain a lot of dangling bonds and unsaturated bonds, they would be a cause of carrier trap center degrading device performance in possible applications such as UV photo-detectors. We experimentally demonstrate hydrogen atoms preferentially incorporate at grain… Show more

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Cited by 2 publications
(8 citation statements)
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“…Afterwards, arctangent function steps are applied as an approximation of the largest absorption located at ∼291 eV that denotes the ionization potential peculiar to diamonds. As it has been already studied on our recent paper, the NEX-AFS C K-edge can be sorted out on the basis of the derivations; specifically, the areas larger than ∼291 eV come from UNCD grains, an a-C and a a-C:H matrices [31]. It should be noted here that the threshold of this absorption differs depending on the morphologies of any carbon-related materials (see, for instance, [45].…”
Section: Resultsmentioning
confidence: 95%
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“…Afterwards, arctangent function steps are applied as an approximation of the largest absorption located at ∼291 eV that denotes the ionization potential peculiar to diamonds. As it has been already studied on our recent paper, the NEX-AFS C K-edge can be sorted out on the basis of the derivations; specifically, the areas larger than ∼291 eV come from UNCD grains, an a-C and a a-C:H matrices [31]. It should be noted here that the threshold of this absorption differs depending on the morphologies of any carbon-related materials (see, for instance, [45].…”
Section: Resultsmentioning
confidence: 95%
“…The correlation with oxygen impurities is unclear at present and should be investigated by conducting measurements on NEXAFS O K-edge. The amount of π * C=C in the films increases approximately accompanied [31]. These spectra were obtained by total electron yield technique, different from the referred work, and processed in a proper manner; therefore, note that both figures cannot be compared simply with each other.…”
Section: Resultsmentioning
confidence: 97%
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