2009
DOI: 10.1088/0957-4484/20/46/465705
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Evidence of space charge regions within semiconductor nanowires from Kelvin probe force microscopy

Abstract: We have studied the equilibrium electrostatic profile of III-V semiconductor nanowires using Kelvin probe force microscopy. Qualitative agreement of the measured surface potential levels and expected Fermi level variation for pure InP and InAs nanowires is obtained from electrical images with spatial resolution as low as 10 nm. Surface potential mapping for pure and heterostructured nanowires suggests the existence of charge transfer mechanisms and the formation of a metal-semiconductor electrical contact at t… Show more

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Cited by 12 publications
(8 citation statements)
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“…In the Amplitude Mode-Kelvin Probe Force Microscopy technique used here, we define the ‘zero’ SP value for the first point of the image; thus only variations of SP along the image can be compared quantitatively. Therefore, in order to compare SP values from different surfaces and thus exclude tip effects arising from metal coating wear [29] we have used the Si substrate as a common reference in the images; for that we have scanned edges of the cellulose film which show the Si substrate as well. We thus compare absolute SP* values from the different samples according to the following equation: SP* = SP(cellulose) – SP(Si).…”
Section: Methodsmentioning
confidence: 99%
“…In the Amplitude Mode-Kelvin Probe Force Microscopy technique used here, we define the ‘zero’ SP value for the first point of the image; thus only variations of SP along the image can be compared quantitatively. Therefore, in order to compare SP values from different surfaces and thus exclude tip effects arising from metal coating wear [29] we have used the Si substrate as a common reference in the images; for that we have scanned edges of the cellulose film which show the Si substrate as well. We thus compare absolute SP* values from the different samples according to the following equation: SP* = SP(cellulose) – SP(Si).…”
Section: Methodsmentioning
confidence: 99%
“…Photoluminescence (PL) studies were performed using micro-PL setup with 325 nm excitation. Topography and SP images were acquired simultaneously using an Agilent 5500 with a three-lock-in amplifier in the amplitude modulation KPFM. , For the measurements, V AC bias at frequencies in the range 10−15 kHz plus a DC bias, V DC , were applied between tip and sample. The detector signal amplitude at the V AC frequency should be proportional to ( V DC − Δϕ) V AC ∂ C /∂ z , where C and z are the capacitance and distance between tip and sample, respectively .…”
mentioning
confidence: 99%
“…The reported MCD and LOD results are quite remarkable considering the simplicity of the InP nanowire device for biosensing tests, working with no field effect amplification and average nanowire diameters larger than surface depleted regions. 72 Moreover, despite the good receptor uniformity and capture binding performance exhibited by our functionalization protocol, no further receptor density optimization was performed prior to the biosensing tests. Table 1.…”
mentioning
confidence: 99%