Evolution of Leakage Current Paths in MC-Si PV Modules From Leading Manufacturers Undergoing High-Voltage Bias Testing

Dhere, Neelkanth G.; Shiradkar, Narendra; Schneller, Eric

doi:10.1109/jphotov.2013.2294764

Cited by 44 publications

(30 citation statements)

References 7 publications

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“…There are a number of other reliability issues affecting PV modules such as PV module disconnection [5], faults associated with maximum power point tracking (MPPT) units [6] and [7], PV micro cracks [8], and fluctuations in the wind speed and humidity variations [9]. All of these factors affect the PV module output power performance, thus decrease the annual energy production.…”

Section: Introductionmentioning

confidence: 99%

70% Decrease of Hot-Spotted Photovoltaic Modules Output Power Loss Using Novel MPPT Algorithm

Dhimish

2019

IEEE Trans. Circuits Syst. II

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The phenomenon of 'Hot-spotting' within photovoltaic (PV) panels, where a mismatched cell/cells heats up, leads to reliability and efficiency issues. In this paper, a novel maximum power point tracking (MPPT) algorithm is developed to compensate for hot-spotted PV module effects, thus increasing the output power and improving reliability. The MPPT algorithm implements two mitigation processes; the first to identify the optimum power-voltage (P-V) curve to track the global maximum power point (GMPP). The second process is to manipulate the output power towards the GMPP through the control of the perturbation step size. In order to verify the appropriateness of the proposed algorithm, multiple hot-spotted PV modules were tested under various environmental conditions. Significantly, the algorithm reduces the hot-spotted PV modules output power loss by at least 70% under all irradiance transition scenarios, slow, medium, and fast.

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Section: Introductionmentioning

confidence: 99%

70% Decrease of Hot-Spotted Photovoltaic Modules Output Power Loss Using Novel MPPT Algorithm

Dhimish

2019

IEEE Trans. Circuits Syst. II

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“…They investigate the evolution of the PID during accelerated testing and also in field operation. Most of the published studies deal with the PID effects only on modules with negative bias polarity [1], [5], [6]. The influence of the positive high voltage stress on the PV module is rarely described in the literature [8], [9].…”

Section: Introductionmentioning

confidence: 99%

Examination of Photovoltaic Silicon Module Degradation Under High-Voltage Bias and Damp Heat by Electroluminescence

Brecl

Bokalič

Topič

2017

Journal of Solar Energy Engineering

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The photovoltaic (PV) modules are in PV arrays normally connected in series and thus some of them exposed to high system voltages since frames of the PV modules are grounded. To predict the long-term PV system energy output and PV module lifetime, it is very important to understand and take into account the degradation process of PV modules under high voltage stress. Accelerated tests under damp heat (over 1300 hours of DH85/60; RH = 85 %, T = 60 °C) of in-house developed monocrystalline silicon PV modules were preformed while connected to a positive or negative voltage bias of 1000 V. The negative biased modules exhibited just a little degradation, while the positive biased modules degraded rapidly. We identified three degradation mechanisms: ion migration, silver corrosion and EVA evaporation. The degradation mechanisms contribute to almost 15 % of the performance loss of the 1000 V positive biased modules after more than 1300 h of DH85/60 testing, while the power degradation of the negative biased modules remains below 3 %.

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“…High voltage stress test on SPV modules are conducted to ascertain the partial discharge behaviour (Dechthummarong et al, 2011) occurring due to unwanted and unprotected lightening strike and Potential Induced Degradation (PID) (Hacke et al, 2011;Del Cueto and Rummel, 2010;Raykov et al, 2012). Dhere et al (2014) has a detail test and analysis for modules made by four different manufacturers primarily to address System-Voltage-induced Degradation (SVID), which is similar to PID, under different environmental conditions. Biasing effect on SPV module made by depositing polycrystalline silicon directly on tempered glass, i.e.…”

Section: Introductionmentioning

confidence: 99%

Modelling of insulation characteristics of Solar Photovoltaic (SPV) modules

Roy

2015

Solar Energy

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Evolution of Leakage Current Paths in MC-Si PV Modules From Leading Manufacturers Undergoing High-Voltage Bias Testing

Cited by 44 publications

References 7 publications

70% Decrease of Hot-Spotted Photovoltaic Modules Output Power Loss Using Novel MPPT Algorithm

70% Decrease of Hot-Spotted Photovoltaic Modules Output Power Loss Using Novel MPPT Algorithm

Examination of Photovoltaic Silicon Module Degradation Under High-Voltage Bias and Damp Heat by Electroluminescence

Modelling of insulation characteristics of Solar Photovoltaic (SPV) modules

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