Evolution of microstructure in amorphous hydrogenated silicon

Abstract

On the correlation among photodegradation, charged dangling bonds and microstructure in hydrogenated amorphous silicon

Morphologies of Solid Surfaces Produced far from Equilibrium

“…4 we found [64] that the Htivghens Construction actually produces mathematical singularites Ccwzps") at exactly the location where the mnich more accurate "eo uation of motion" Eo. 4 produced grooves-The evolution of cusps in the Huyghens construction in the presence of noise leads to scaling for the "coarsening length" c(h) (the mean distance between grooves) with exponents which agree well with experiment [12][13][14] In the KPZ model annealing erases the cusp…”

“…One of the major results from this work is the near universality of the cauliflower morphology that is observed on films of essentially anything grown under the proper conditions by a vapor deposition process. [12][13][14] Rasigni et.al. [72,73] have developed a method to obtain quantitative height profiles of rough surfaces.…”

“…However, the algorithm was very computer intensive and could not be used to obtain the long-time evolution of the groove structure as for instance seen in the sputter deposition of amorphous graphite films by Messier and Yehoda [12][13][14] To that purpose, we investigated [64) the connection between our non-local growth algorithm, and the Huyghens Construction, which is much less computer intensive. Via numerical simulation of Eq.…”

“…Thus, the q-2 mechanism for healing the surface might be characterized as a "sputter/redeposition" process in which atoms move from one spot on the surface to another as flying debris from the impact of the ion. [ 14] By expanding the exponential term in Eq. (9) for the limit q -.…”

“…A great deal of experimental work involving rough surfaces has been performed with different forms of microscopy, [12][13][14] especially scanning electron microscopy (SEM) and transmission electron microscopy (TEM). An advantage of electron microscope techniques is that they can be used to obtain valuable information about the cross section and internal structure of a film, as long as the sectioning process does not damage the film too heavily.…”