Evolution of<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mrow><mml:mi>s</mml:mi><mml:msup><mml:mi>p</mml:mi><mml:mn mathvariant="italic">2</mml:mn></mml:msup></mml:mrow></mml:math>networks with substrate temperature in amorphous carbon films: Experiment and theory

Gago, R.; Vinnichenko, M.; Jäger, H.U.; Belov, A. Yu.; Jiménez, I.; Huang, Nan; Sun, Hong; Maitz, Manfred F.

doi:10.1103/physrevb.72.014120

Cited by 67 publications

(40 citation statements)

References 59 publications

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“…Above IR (from 5500 cm -1 (0.7 eV) towards higher energies), the spectra of the two ordered films (g-and FL-CN x ) look quite similar and are also comparable to those of films presented in earlier work [19,20]. The spectra of the two amorphous films show similarities to films in a study by Broitman et al [21] although our a-CN x film reaches higher values of 2 in the NIR region.…”

Section: Figure 3 Hrtem Micrographs Of (A) A-c (B) A-cn X (C) G-cnsupporting

confidence: 67%

Spectroscopic ellipsometry characterization of amorphous carbon and amorphous, graphitic and fullerene-like carbon nitride thin films

et al. 2009

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Section: Figure 3 Hrtem Micrographs Of (A) A-c (B) A-cn X (C) G-cnsupporting

confidence: 67%

Spectroscopic ellipsometry characterization of amorphous carbon and amorphous, graphitic and fullerene-like carbon nitride thin films

et al. 2009

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“…However, others have computed the area of the C1s→π* feature by integrating the spectrum between 282 and 286 eV 67 or between 282 and 287 eV 30,33,34 . As for the C1s →σ* absorption feature, its area is usually determined by numerically integrating the spectrum between two limits x 1 and x 2 , which are chosen to represent the σ* contribution to the experimental data.…”

Section: Section I ð Methodology For the Quantitative Evaluation Of Tmentioning

confidence: 99%

“…Since the π*/σ* ratio depends on the angle of the impinging X-ray photons relative to the HOPG basal planes 58 , some authors have used other reference materials for quantification, such as fullerene films 32,68 , disordered forms of graphite (e.g., Ar + sputtered HOPG) 14,33,34 , and evaporated carbon 67 . The use of these materials for the quantitative evaluation of the carbon hybridization state from NEXAFS spectra will not be discussed in this work.…”

Section: Section I ð Methodology For the Quantitative Evaluation Of Tmentioning

confidence: 99%

Quantitative Evaluation of the Carbon Hybridization State by Near Edge X-ray Absorption Fine Structure Spectroscopy

2016

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The characterization of the local bonding configuration of carbon in carbon-based materials is of paramount importance since the properties of such materials strongly depend on the distribution of carbon hybridization states, the local ordering, and the degree of hydrogenation. Carbon 1s near edge X-ray absorption fine structure (NEXAFS) spectroscopy is one of the most powerful techniques for gaining insights into the bonding configuration of near-surface carbon atoms. The common methodology for quantitatively evaluating the carbon hybridization state using C1s NEXAFS measurements, which is based on the analysis of the sample of interest and of a highly ordered pyrolytic graphite (HOPG) reference sample, was reviewed and critically assessed, noting that inconsistencies are found in the literature in applying this method. A theoretical rationale for the specific experimental conditions to be used for the acquisition of HOPG reference spectra is presented together with the potential sources of uncertainty and errors in the correctly computed fraction of sp 2 -bonded carbon. This provides a specific method for analyzing the distribution of carbon hybridization state using NEXAFS spectroscopy. As an illustrative example, a hydrogenated amorphous carbon film was analyzed using this method, and showed good agreement with X-ray photoelectron spectroscopy (which is surface sensitive).Furthermore, the results were consistent with analysis from Raman spectroscopy (which is not surface sensitive), indicating the absence of a structurally different near-surface region in this particular thin film material. The present work can assist surface scientists in the analysis of NEXAFS spectra for the accurate characterization of the structure of carbon-based materials.3

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“…Erosion rates obtained using Raman micro-spectroscopy are compared to those obtained using ellipsometry, the erosion rate of heattreated a-C:H films varying by more than one order of magnitude between 100 and 450 • C [5]. The imaginary part of the refractive index obtained by the two methods can also be compared, the absorption of visible photons significantly increasing with heat-treatments [6]. We finally discuss the opportunity of using Raman micro-spectroscopy for future quantitative studies relevant for magnetic fusion plasma-wall interaction issues.…”

Section: Introductionmentioning

confidence: 99%

Raman micro-spectroscopy as a tool to measure the absorption coefficient and the erosion rate of hydrogenated amorphous carbon films heat-treated under hydrogen bombardment

Pardanaud¹,

Aréou²,

Martin³

et al. 2012

Diamond and Related Materials

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We present a fast and simple way to determine the erosion rate and absorption coefficient of hydrogenated amorphous carbon films exposed to a hydrogen atomic source based on ex-situ Raman micro-spectroscopy. Results are compared to ellipsometry measurement. The method is applied to films eroded at different temperatures. A maximum of the erosion rate is found at ∼ 450 • C in agreement with previous results. This technique is suitable for future quantitative studies on the erosion of thin carbonaceous films, especially of interest for plasma wall interactions occurring in thermonuclear fusion devices.

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Evolution ofsp2networks with substrate temperature in amorphous carbon films: Experiment and theory

Cited by 67 publications

References 59 publications

Spectroscopic ellipsometry characterization of amorphous carbon and amorphous, graphitic and fullerene-like carbon nitride thin films

Spectroscopic ellipsometry characterization of amorphous carbon and amorphous, graphitic and fullerene-like carbon nitride thin films

Quantitative Evaluation of the Carbon Hybridization State by Near Edge X-ray Absorption Fine Structure Spectroscopy

Raman micro-spectroscopy as a tool to measure the absorption coefficient and the erosion rate of hydrogenated amorphous carbon films heat-treated under hydrogen bombardment

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