2010
DOI: 10.1149/1.3298474
|View full text |Cite
|
Sign up to set email alerts
|

Evolution of Surface Roughness in Electrodeposited Co–Ni–P and Co–Ni Films

Abstract: Dynamic scaling analysis was applied to the investigation of the roughening kinetics of Co–Ni and Co–Ni–P films electrodeposited from acidic (pH 3) chloride solutions. Co–Ni films exhibit uninhibited growth with the formation of well-defined crystal facets, while Co–Ni–P films exhibit a granular microstructure with a much smaller apparent grain size. Correspondingly, the rate at which Co–Ni–P films roughen is much slower than that of the Co–Ni films. This is ascribed to autocatalytic processes during Co–Ni–P d… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1

Citation Types

0
3
0

Year Published

2011
2011
2022
2022

Publication Types

Select...
5
1

Relationship

0
6

Authors

Journals

citations
Cited by 8 publications
(3 citation statements)
references
References 25 publications
0
3
0
Order By: Relevance
“…The roughness measurement (Rq), found using the commercial image analysis software, represents the average deviation of height from the mean over the entire image area. The Ws roughness measurement is a more rigorous analysis that is able to quantitatively describe surface features (i.e., grain structure size) and permits differentiation between short-and long-range roughness [52][53][54]. The Ws roughness number is determined as a function of area after sampling multiple "box" sizes collected for each image.…”
Section: Film Topography Characterization By Scanning Probe Microscopymentioning
confidence: 99%
See 1 more Smart Citation
“…The roughness measurement (Rq), found using the commercial image analysis software, represents the average deviation of height from the mean over the entire image area. The Ws roughness measurement is a more rigorous analysis that is able to quantitatively describe surface features (i.e., grain structure size) and permits differentiation between short-and long-range roughness [52][53][54]. The Ws roughness number is determined as a function of area after sampling multiple "box" sizes collected for each image.…”
Section: Film Topography Characterization By Scanning Probe Microscopymentioning
confidence: 99%
“…The 3 L sample has a curve that has a sharper increase in roughness indicating that it has a high degree of short-range roughness, while the 30 L sample is smoother over those short ranges. By analyzing these curves, the typical feature (grain) size can be determined [52][53][54]. The grain size is a fit parameter that correlates to the length of the box at which the Ws roughness becomes constant.…”
Section: Film Topography Characterization By Scanning Probe Microscopymentioning
confidence: 99%
“…Phosphorous atoms do not penetrate inside grains formed by metal atoms but are positioned along their boundaries [5]. This prevents the growth of grains; therefore, their size in the films prepared by chemical deposition is much smaller than in the Со-Ni films prepared by the electrolytic method [6]. At the same time, the rate of autocatalytic reactions ( 1) is different for different metals.…”
Section: Discussionmentioning
confidence: 99%