“…Recent advances in full-field X-ray nano-imaging with transmission X-ray microscopy (TXM) (Ge et al, 2018;Xu et al, 2017;Zhao et al, 2018;Cheng et al, 2017) have generated unprecedented capabilities to analyze materials at sub-30 nm resolution in 3D. Impactful applications include energy storage (Tsai et al, 2018; Landa-Medrano et al, 2017; Yang et al, 2019), catalysis (Gonzalez-Jimenez et al, 2012), metals and alloys (Kaira et al, 2019;Milhet et al, 2018), high-pressure studies (Mao et al, 2019), and fuel cells (Chen-Wiegart, Harris et al, 2012;Harris et al, 2015;Izzo et al, 2008). Recently, the Full-field X-ray Imaging (FXI) beamline at National Synchrotron Light Source-II (NSLS-II) demonstrated that full nano-tomography images can be performed within 1 min (Ge et al, 2018), enabling dynamical and kinetic studies with much higher temporal and spatial resolutions than previously possible.…”