13th InterSociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems 2012
DOI: 10.1109/itherm.2012.6231505
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Evolution of the tension/compression and shear cyclic stress-strain behavior of lead-free solder subjected to isothermal aging

Abstract: The microstructure, mechanical response, and failure behavior of lead free solder joints in electronic assemblies are constantly evolving when exposed to isothermal aging and/or thermal cycling environments. In our prior work, we have demonstrated that the observed material behavior variations of Sn-Ag-Cu (SAC) lead free solders during elevated temperature aging were unexpectedly large and universally detrimental to reliability.Solder joints in electronic assemblies are typically subjected to thermal cycling, … Show more

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Cited by 47 publications
(5 citation statements)
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“…The six Anand parameters ŝ , ξ , A, Q/R, n and m are determined using a nonlinear least-squares regression fit of eq. (14) to the recorded saturation stress (UTS) vs. temperature and strain rate data. 2.…”
Section: Procedures For Determining the Anand Model Parameters From Unmentioning
confidence: 99%
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“…The six Anand parameters ŝ , ξ , A, Q/R, n and m are determined using a nonlinear least-squares regression fit of eq. (14) to the recorded saturation stress (UTS) vs. temperature and strain rate data. 2.…”
Section: Procedures For Determining the Anand Model Parameters From Unmentioning
confidence: 99%
“…In the current study, a vacuum suction process was utilized to form solder uniaxial test specimens with controlled microstructure in high precision rectangular cross-section glass tubes [7][8][9][10][11][12][13][14]. Initially, bulk solder material is melted in a quartz crucible using circular heating elements (see Figure 1).…”
Section: Uniaxial Test Sample Preparationmentioning
confidence: 99%
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