Examination of the interface of a model adhesive joint by surface analysis: a study by XPS and ToF‐SIMS

Abstract

Abstract:Model samples of the interface of an adhesive joint containing small levels of aminopropyl triethoxysilane (APS) have been prepared in order to examine the interface formed with an aluminium substrate. X-ray photoelectron (XPS) and time of flight secondary ion mass spectrometry (ToF-SIMS) has been used to analyse and image the interface region in between the aluminium and an epoxy adhesive in order to ascertain the reactions by the organosilane, present as a minor component within the system. It was found that APS was present at the interface between the adhesive and the substrate and that it had reacted with the substrate forming a covalent bond and was also crosslinked within the adhesive. Evidence of near to full hydrolysis of APS is also present within the spectra.

The role of the adhesion promoter in a model water‐borne primer

“…Having determined the primer and its boundaries at the topcoat and metal interface, and characterising all the individual components present in the formulation, it can be concluded that nitrogen is associated with the adhesion promoter and specific to this molecule. Thus, one might expect that nitrogen signal to reach to the maximum level at the metal/primer interface, as observed in extensive work on organosilanes from this laboratory . Figure shows the positive ToF‐SIMS spectrum of the adhesion promoter as well as identifying the most intense characteristic fragments.…”

Superhydrophobic surfaces based on self-organized TiO2-nanotubes

“…As reported in literature, these functional groups can react with the hydroxyl groups of the metal surface [36]. During the functionalization of the TiO 2 -nanotubes, the hydroxyl groups of the TiO 2 -nanotubes chemically react with the functional groups of the water repellent coating.…”

Organofunktionelle Silane als Haftvermittler

“… Diffusion Diffusion des APTES Haftvermittlers zur Grenzfläche mit dem Aluminiumsubstrat: Tiefenprofil der mit XPS bestimmten, atomaren Siliciumkonzentration im Epoxidklebstoff [33]. …”