Examining the Spatial Frequency Components of a Digital Dental Detector

Abstract

Abstract. Digital X-ray detectors are widely used in dental radiography. The scope of this work is the examination of the spatial frequency component of a dedicated dental CMOS detector. A commercially available SCHICK CDR CMOS detector was irradiated at a Del Medical Eureka X-ray system at 60kVp and 70kVp. The irradiation setup included images of an edge, for Modulation Transfer Function (MTF) calculation. The air-KERMA was measured with an RTI PIRANHA X-ray multimeter. The images were evaluated in 'for presentation' format with the use of ImageJ software. The linear range of the detector was found in the range 13µGy-183µGy at 60 kVp and 18µGy-180µGy at 70 kVp. By inspecting the MTF curves it was found that MTF(6lp/mm)60kVp=0.29 and MTF(6lp/mm)70kVp=0.25. The inspection of the Normalized Noise Power Spetrum (NNPS) showed similar low noise components. Our results indicate that this detector presents comparable performance at both kVp, although its Xray response (pixel value vs air KERMA) was not equal to previously published results, for the same detector type.