In this study, we
have thoroughly investigated the tensile mechanical
behavior of monolayer XN (X = Ga, In) using molecular dynamics simulations.
The effects of temperature (100 to 800 K) and point vacancies (PVs,
0.1 to 1%) on fracture stress, strain, and elastic modulus of GaN
and InN are studied. The effects of edge chiralities on the tensile
mechanical behavior of monolayer XN are also explored. We find that
the elastic modulus, tensile strength, and fracture strain reduce
with increasing temperature. The point defects cause the stress to
be condensed in the vicinity of the vacancies, resulting in straightforward
damage. On the other hand, all the mechanical behaviors such as fracture
stress, elastic modulus, and fracture strain show substantial anisotropic
nature in these materials. To explain the influence of temperature
and PVs, the radial distribution function (RDF) at diverse temperatures
and potential energy/atom at different vacancy concentrations are
calculated. The intensity of the RDF peaks decreases with increasing
temperature, and the presence of PVs leads to an increase in potential
energy/atom. The current work provides an insight into adjusting the
tensile mechanical behaviors by making vacancy defects in XN (X =
Ga, In) and provides a guideline for the applications of XN (X = Ga,
In) in flexible nanoelectronic and nanoelectromechanical devices.