Size effects on the magnetization reversal behavior of exchange bias modulated thin films J. Appl. Phys.The training effect of the so-called exchange bias in coupled polycrystalline NiFe/ IrMn thin films has been experimentally and theoretically investigated. A different formula is used to describe the exchange bias dependence on the measurement cycle number. It can be understood to be a consequence of the antiferromagnetic domain dynamics based on the Kolmogorov-Avrami ͓Izv. Akad. Nauk, Ser. Math. 3, 355 ͑1937͒; J. Chem. Phys. 8, 212 ͑1940͔͒ model, which describes the nucleation and growth of antiferromagnetic domains in the film structures.