Abstract:Silver photodiffusion into amorphous chalcogenides is the photoinduced phenomenon, in which mobile Ag ions are injected into semiconductor films, and is applicable to nonvolatile memory devices. To understand the role of light illumination in the silver diffusion into a chalcogenide layer, the excitation light energy dependence of silver photodiffusion in Ag/a‐Ge20S80/Si substrate stacks is investigated by neutron reflectivity, X‐ray reflectivity, and X‐ray diffraction. The measurements reveal that there is an… Show more
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