1959
DOI: 10.1016/0022-3697(59)90372-5
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Exciton and phonon effects in the absorption spectra of germanium and silicon

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Cited by 146 publications
(47 citation statements)
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“…There are three main models that have been effectively used to approximate the indirect absorption spectra in Ge and Si bulk materials: a one-phonon model, 14,17,35,36 a multiple-phonon model 15,16,18,20,37 and an electric-field dependent model. 19 The one-phonon model (Eq.…”
Section: Modeling Indirect Absorptionmentioning
confidence: 99%
See 1 more Smart Citation
“…There are three main models that have been effectively used to approximate the indirect absorption spectra in Ge and Si bulk materials: a one-phonon model, 14,17,35,36 a multiple-phonon model 15,16,18,20,37 and an electric-field dependent model. 19 The one-phonon model (Eq.…”
Section: Modeling Indirect Absorptionmentioning
confidence: 99%
“…This additional loss is largely due to indirect absorption and it is important to fully understand this mechanism in detail to optimize future modulator designs in Ge or GeSi. While bulk Ge and Si have been extensively studied with respect to their indirect absorption, [14][15][16][17][18][19][20] how this absorption changes in a quantum well (QW) heterostructures (for QCSE devices ) has not yet been similarly investigated. Only one published paper shows the presence of the longitudinal acoustic (LA) phonon in Ge/SiGe quantum wells with the same energy as that of the bulk material.…”
Section: Introductionmentioning
confidence: 99%
“…!.! [23,24]. The free excitons annihilation luminescence for Ge should therefore have the form: [25].…”
Section: Temperature Dependencementioning
confidence: 99%
“…при hν ∼ E g Si (E g Si ∼ 1.12 эВ, 293 K -ширина за-прещенной зоны Si)) [12], значительная часть падаю-щего на фотодиод излучения поглощается в глубине структуры. Так, интенсивность излучения с hν ∼ 1.12 эВ уменьшается в e раз на расстоянии ∼ α вклад в собственную ФЧ Si вносит механизм, связанный с диффузией неосновных носителей заряда из глубины структуры к границе области пространственного за-ряда (ОПЗ) p−n-перехода и дальнейшим их дрейфом в электрическом поле перехода к соответствующему контакту [13].…”
Section: результаты и обсуждениеunclassified