Exergy, Energy, and Dynamic Parameter Analysis of Indigenously Developed Low-Concentration Photovoltaic System

Abstract

Piecewise linear parabolic trough collector (PLPTC) is designed and developed to concentrate solar radiation on monocrystalline silicon based photovoltaic module. A theoretical model is used to perform electrical energy and exergy analysis of low-concentration photovoltaic (LCPV) system working under actual test conditions (ATC). The exergy efficiency of LCPV system is in the range from 5.1% to 4.82% with increasing rate of input exergy rate from 30.81 W to 96.12 W, when concentration ratio changes from 1.85 to 5.17 Sun. Short-circuit current shows increasing trend with increasing input exergy rate of≈0.011 A/W. Power conversion efficiency decreases from 7.07 to 5.66%, and open-circuit voltage decreases from 9.86 to 8.24 V with temperature coefficient of voltage≈-0.021 V/K under ATC. The results confirm that the commercially available silicon solar PV module performs satisfactorily under low concentration.

Exergy analysis on solar thermal systems: A better understanding of their sustainability

“…A detailed analysis was performed by calculating energy and exergy efficiencies. Yadav et al [36] developed a theoretical model to perform energy and exergy analysis of linear parabolic trough collector used to concentrate solar radiation on a monocrystalline silicon based photovoltaic module.…”

Recombination kinetics in a silicon solar cell at low concentration: electro-analytical characterization of space-charge and quasi-neutral regions

“…[4][5][6][7][8][9][10][11][12] In our previous articles, we reported a real time analysis of a LCPV system and its dynamic behavior. 1,8,[20][21][22] However, the major disadvantages of the DC techniques used for solar cell characterization are: (1) they do not help to probe the AC parameters that are necessary for designing the dynamic load of such devices, 23 and (2) the transient response of charge carriers is difficult to estimate and is very important for understanding device behavior over time.…”