1993
DOI: 10.1063/1.108600
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Existence of extinction temperature in WSix film growth from WF6 and SiH4: An indication of the role played by radical chain reactions

Abstract: Low pressure chemical vapor deposition (LPCVD) was carried out to deposit tungsten silicide films (WSix) from WF6 and SiH4 in a low temperature range from 80 to 390 °C, using a tubular reactor system. Drastic decrease of the deposition rate occurred at an extinction temperature Tex. Increase of the reactor size in the range from 4 to 22 mmφ decreased Tex from 140 to 80 °C. Above Tex, the sticking probability of the film forming species (η) and the film composition, x of WSix , did not depend on the reactor dia… Show more

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Cited by 11 publications
(11 citation statements)
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“…For SiH 2 Cl 2 supplied in Ar, T ex decreased from 500°C to 450°C by increasing the reactor diameter from 15.6 to 22.0 mm. This trend suggests that gas-phase radical chain reactions are an important part of the overall reaction mechanism, as indicated by our previous results [18,24]. For a given reactor diameter as 15.6 mm, Table 1 shows that H 2 addition in place of Ar can lower T ex from 500°C to 450°C.…”
Section: Resultsmentioning
confidence: 60%
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“…For SiH 2 Cl 2 supplied in Ar, T ex decreased from 500°C to 450°C by increasing the reactor diameter from 15.6 to 22.0 mm. This trend suggests that gas-phase radical chain reactions are an important part of the overall reaction mechanism, as indicated by our previous results [18,24]. For a given reactor diameter as 15.6 mm, Table 1 shows that H 2 addition in place of Ar can lower T ex from 500°C to 450°C.…”
Section: Resultsmentioning
confidence: 60%
“…(1) Radical chain reactions in the gas phase dominate the formation of the film-growth species [18] and deposition can occur down to T sub = 40°C [19]. (2) The silicon content of WSi x films strongly depends on T sub .…”
Section: Introductionmentioning
confidence: 99%
“…The simulations were made without adjusting these rate parameters. To assess the accuracy of virtual experiments based on data obtained from small-scale experi- 3 6.18 473.72 WF 2 (SiH 3 ) 4 6.50 506.93 WF(SiH 3 ) 5 6.82 540.16 W(SiH 3 ) 6 7.12 573.44 ments to simulate actual conditions in full-scale reactors, it was important to do the simulations without adjusting parameters.…”
Section: Simulations Of a Cold-wall Reactormentioning
confidence: 99%
“…[3][4][5] Figure 1 shows a schematic of the experimental equipment used in the present work. The reactor was a glass tube heated by a resistive heater 10 to 22 cm long.…”
Section: Extraction Of Chemistry From Small-scale Experimentsmentioning
confidence: 99%
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