Experimental characterization of borosilicate glasses fabricated from rice husk ash using the resonant cavity method

Pereira, Vinícius M.; Hardt, Luis G.; Lima, Leticia S.C.; Menezes, J. W.; Valsecchi, Chiara; Heckler, Marcos V. T.; Armas, Luis Enrique Gomez

doi:10.1016/j.mseb.2022.116138

Cited by 2 publications

(1 citation statement)

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“…Additionally, as it is a reusable material from abundant biomass and, consequently, very easy to obtain, it is quite competitive and interesting to be used in the development of radiation absorbent materials (RAM). In addition, low dielectric-loss tangent was also reported by other authors 28 , 33 on glasses fabricated using RHA as raw material. In this sense, this study open the possibility of using the RH, and consequently RHA, produced on Brazilian territory as source for developing microwave absorption materials.…”

Section: Resultssupporting

confidence: 71%

Characterization of dielectric properties of residual ashes obtained from rice husk and annoni grass

Pereira,

Heckler,

Vasconcellos

et al. 2023

Sci Rep

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This paper presents a study about the characterization of dielectric properties (dielectric constant $${\varepsilon }_{r}$$ ε r and dielectric-loss constant $$\mathrm{tan}\delta$$ tan δ ) of samples derived from two different biomass types: rice husk ash (RHA) and annoni grass ash (AGA).The procedure is carried out using the resonant cavity method along with a vector network analyzer. For this purpose, four different ashes were produced, by burning rice husk and annoni grass at two different temperatures and burning times: 400 °C/30 min (RHA40030 and AGA40030) and 800 °C/5 h (RHA8005h and AGA8005h). These ashes were combined with Bakelite to produce cylindrical samples with diameter of 30 mm and thickness of 4.5 mm, which were characterized considering the frequency in the test band for 5G technologies ($${f}_{o}=3.5$$ f o = 3.5 GHz). Experimental results showed that the samples burnt at high temperature showed very high $$\mathrm{tan \delta }$$ tan δ when compared to the samples burnt at low temperature, mainly for AGA8005h. These values are $$\mathrm{tan \delta }=$$ tan δ = 0.1690 and 1.4900 for RHA8005h and AGA8005h, respectively. The resulting dielectric constants are $${\varepsilon }_{r}$$ ε r = 3.87 for RHA8005h and $${\varepsilon }_{r}$$ ε r = 15.14 for AGA8005h). These very high dielectric loss tangent, indicate that these materials exhibit formidable properties for electromagnetic energy absorption, hence allowing the application as radiation-absorbent material (RAM).

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Section: Resultssupporting

confidence: 71%