2015
DOI: 10.1016/j.sse.2015.05.032
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Experimental demonstration of improved analog device performance of nanowire-TFETs

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Cited by 10 publications
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“…To examine the capability of TFET in analogue circuits and also to scrutinise its analogue characteristics in this domain, we have considered Verilog A model for its simplicity and accuracy [21]. Importance of gate all around (GAA) structure for its exceptional electrostatic control [22][23][24] and the benefit of III-V materials have already been illustrated in many papers [25][26][27]. Therefore, in this work, the look-up table used in Verilog A model is obtained through TCAD simulation of AlGaSb/GaAsP charge plasma-TFET (CP-TFET) [27] and the circuit simulation is finally carried out in Cadence virtuoso.…”
mentioning
confidence: 99%
“…To examine the capability of TFET in analogue circuits and also to scrutinise its analogue characteristics in this domain, we have considered Verilog A model for its simplicity and accuracy [21]. Importance of gate all around (GAA) structure for its exceptional electrostatic control [22][23][24] and the benefit of III-V materials have already been illustrated in many papers [25][26][27]. Therefore, in this work, the look-up table used in Verilog A model is obtained through TCAD simulation of AlGaSb/GaAsP charge plasma-TFET (CP-TFET) [27] and the circuit simulation is finally carried out in Cadence virtuoso.…”
mentioning
confidence: 99%