2012
DOI: 10.1134/s106378261205017x
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Experimental evaluation of the carrier lifetime in GaAs grown at low temperature

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Cited by 10 publications
(9 citation statements)
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“…When defects are mostly eliminated the important role of the buffer is limitation of electronic transport from the InAs QDs to the continuum of states in LT‐GaAs. These states are known to have a broad energy distribution and ultrashort relaxation time in the range of hundreds of fs . Our analysis shows that the set of related phenomena can be consistently described in terms of the quantum‐mechanical model with geometrical parameters taken from TEM.…”
Section: Discussionmentioning
confidence: 73%
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“…When defects are mostly eliminated the important role of the buffer is limitation of electronic transport from the InAs QDs to the continuum of states in LT‐GaAs. These states are known to have a broad energy distribution and ultrashort relaxation time in the range of hundreds of fs . Our analysis shows that the set of related phenomena can be consistently described in terms of the quantum‐mechanical model with geometrical parameters taken from TEM.…”
Section: Discussionmentioning
confidence: 73%
“…The important difference of BP2251 from the reference sample is proximity of the LT‐GaAs layer. The latter is known to have a very short lifetime of non‐equilibrium carriers due to a very high density of the excess‐arsenic‐related point defects . It should be noted that the low‐temperature overgrowth does not make any noticeable changes in the atomic structure of the underlying GaAs buffer and QDs grown at much higher temperature.…”
Section: Discussionmentioning
confidence: 99%
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