Experimental Investigation of Surface Potentials of Materials Under Electron Spectra Representative of GEO and MEO Worst Case Environments

Matéo‐Vélez, Jean-Charles; Paulmier, Thierry; Sicard, A.; Dirassen, B.; Payan, D.

doi:10.1109/tps.2019.2925413

Cited by 9 publications

(12 citation statements)

References 11 publications

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“…(2013), and Matéo‐Vélez et al. (2018, 2019) (more citations can be found in Section 1), where it was stated that rather moderate Kp values were observed during the charging events. Charging events do not necessarily require high values of Kp .…”

Section: Discussionmentioning

confidence: 94%

“…These four groups of events comprise the main dataset of our study. They also form the basis of on-ground tests of materials under multi-energetic electron beams (Matéo-Vélez et al, 2019). Among the four criteria, one criterion is based on the measured spacecraft potential and three criteria are based on integral electron fluxes.…”

Section: Accepted Articlementioning

confidence: 99%

“…Such a threshold could be a potential below −100 V, or a flux of E 10-keV electrons above 7 Another useful study will be to perform similar as in the present study analysis by separating events outside and inside eclipse to get the events in PG5k criterion in eclipse and the events in PGXk criterion outside eclipse with X being a potential to be determined. For the Van Allen Probes data analysis, Matéo-Vélez et al (2019) have used −100 V for potential X. Criteria based on satellite potential could distinguish events with a potential exceeding a given potential (as, e.g., −100 V).…”

Section: Our Last Parameter Ismentioning

confidence: 99%

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Worst‐Case Severe Environments for Surface Charging Observed at LANL Satellites as Dependent on Solar Wind and Geomagnetic Conditions

et al. 2021

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The 400 worst‐case severe environments for surface charging detected at Los Alamos National Laboratory satellites during the years of 1990–2005 as binned by the definitions of four criteria developed by Matéo‐Vélez et al. (2018, https://doi.org/10.1002/2017sw001689) and the solar wind and Interplanetary Magnetic Field (IMF) parameters and geomagnetic activity indices are analyzed. The conducted analysis shows that only Auroral Electrojet/Auroral Lower index determines the highest risk for severe environments for surface charging to happen. The presence of a substorm with the southward turning pattern in IMF Bz indicates that the environment can be severe for surface charging to occur but this environment will not depend on whether a substorm was moderate or intense. No clear dependence on IMF Bz is found for risk to a severe environment to occur. Appearances of severe environments for surface charging do not necessarily require high values of Kp (Planetarische Kennziffer) and no storm is needed for such an event to be detected. Among solar wind parameters, solar wind velocity Vsw is directly related to the highest risk of severe environments, dependent on the Vsw value; and number density Nsw is of no importance. Two criteria for severe environment events based on the enhancements of low energy particle fluxes exhibit clearer dependencies on the solar wind and IMF parameters and geomagnetic activity indices with more distinct patterns in their time history.

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Section: Discussionmentioning

confidence: 94%

Section: Accepted Articlementioning

confidence: 99%

Section: Our Last Parameter Ismentioning

confidence: 99%

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Worst‐Case Severe Environments for Surface Charging Observed at LANL Satellites as Dependent on Solar Wind and Geomagnetic Conditions

et al. 2021

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“…The ONERA researchers employed the surface potential decay method sometimes in the presence of fully penetrating electrons with a current density close to real values in orbit. Analyzing these data allows to find the RIC decay curves from which the two-trap model parameters can be retrieved [38][39][40]. In our opinion, this information should not be directly compared with RFV model parameters in view of discrepancies between RIC data found by potential-decay method and a direct RIC current measuring technique reported in [38].…”

Section: Discussionmentioning

confidence: 99%

Time-Resolved Radiation-Induced Conductivity of Polyimide and Its Description Using the Multiple Trapping Formalism

et al. 2019

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Polymer dielectrics subjected to intense radiation fluxes exhibit a radiation-induced conductivity (RIC). Polyimide is a good dielectric with excellent mechanical and thermal properties featuring high radiation resistance currently widely used in the spacecraft industry. Its RIC has been extensively studied in several laboratories. The purpose of the present study is to make a direct measurement of the RIC for both pulsed and continuous irradiation using a current sensing technique, which is contrary to the indirect method employing a surface-potential decay technique that is now preferred by spacecraft charging engineers. Our experiments are done in a small-signal regime excluding any recombination and dose effects. In combination with existing computer codes, we managed to develop further the conventional multiple trapping formalism and the RIC theory based on it. The main idea is to supplement an exponential trap distribution responsible for a dominant dispersive carrier transport in polymers with a small concentration of inherent deep traps which may or may not have an energy distribution. In line with this reasoning, we propose a tentative set of RIC model parameters for polyimide that accounts for the observed experimental data. The findings and their implications are discussed in a broad context of previous studies.

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“…Such process can entail important failures in space applications, for example. 15,16 Thus, the dielectric charging phenomenon has several consequences on the TEEY: (i) it modifies the energy of primary electrons, hence their penetration depth; (ii) it impacts the transport of secondary electrons in the dielectric and (iii) it alters their release to the vacuum. These features of dielectric materials make the experimental determination of the true TEEY (the one corresponding to an uncharged dielectric surface) delicate, and the modeling of TEEY difficult.…”

Section: Introductionmentioning

confidence: 99%

Atypical secondary electron emission yield curves of very thin SiO2 layers: Experiments and modeling

Rigoudy

Belhaj

Dadouch

et al. 2021

Journal of Applied Physics

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The secondary electron emission phenomenon often refers to the emission of electrons as a result of the interaction of impinging energetic electrons with the surface of a material. Although it is fairly well described for metals, with a typical shape of the total electron emission yield (TEEY) first increasing to reach a maximum and then decreasing along with the energy increase of the primary electrons, there is still a lack of data and detailed analysis for dielectrics, in particular thin layers. The present work proposes a new insight in the electron emission phenomenon from very thin dielectric layers. It reports on the TEEY from very thin SiO2 layers, less than 100 nm. It is found that a departure from the typical shape of the TEEY curve occurs for primary electrons with energy of around 1 keV. The TEEY curve presents a dip, a local minimum that might be as deep as below 1. This atypical shape depends substantially on the layer thickness. The measured TEEY are compared to an electron emission 1D-model in which we consider the combined effect of the space-charge electric field induced by trapped charges in the dielectric layer and of the processes of field dependent conductivity (FDC) and radiation induced conductivity (RIC) on the fate of secondary electrons. Those mechanisms govern the charge transport in the dielectric, and consequently the electron emission. The effects of the SiO2 layer thickness, incidence angle of the primary electrons and an applied external electric field on the TEEY curves are reported.

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Experimental Investigation of Surface Potentials of Materials Under Electron Spectra Representative of GEO and MEO Worst Case Environments

Cited by 9 publications

References 11 publications

Worst‐Case Severe Environments for Surface Charging Observed at LANL Satellites as Dependent on Solar Wind and Geomagnetic Conditions

Worst‐Case Severe Environments for Surface Charging Observed at LANL Satellites as Dependent on Solar Wind and Geomagnetic Conditions

Time-Resolved Radiation-Induced Conductivity of Polyimide and Its Description Using the Multiple Trapping Formalism

Atypical secondary electron emission yield curves of very thin SiO2 layers: Experiments and modeling

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