In this paper we perform a thorough investigation of the temperature coefficients of c-Si solar cells and wafers, based on both experimental data and device simulations. Groups of neighboring wafers were selected from different heights of four high performance multicrystalline silicon ingots cast using different dopants concentrations and Si feedstocks; Three different target resistivities of compensated silicon ingots based on Elkem Solar Silicon (ESS ® ), which are purified through a metallurgical route, and one non-compensated reference ingot. The wafers were processed into Al-BSF and PERCT type solar cells, as well as into lifetime samples subjected to selected solar cell processing steps before being etched down and re-passivated to assess the bulk lifetime of the final cells. Temperature-dependent photoluminescence imaging was used to study the spatial distribution of the carrier lifetime and the temperature coefficient of the lifetime. We observe a beneficial effect of higher doping levels on the temperature coefficients of the short circuit current in PERCT type cells, with the most favorable temperature coefficients are found in the ingot doped to 0.5 Ω-cm. Increasingly beneficial temperature coefficients in is also observed with increasing height in each ingot, which might be attributed to a combination of small variations in the dopant concentrations and to a clear increase in the temperature coefficient of the carrier lifetime with increasing ingot height. The latter point is also in agreement with the changes in the so-called gamma parameter of the open circuit voltage throughout the ingot. To build a more fundamental understanding of the experimental results the temperature dependence of the solar cells was simulated using PC1Dmod6.2. We find that the experimental temperature coefficients of the final cells can be reproduced in device simulations within 8 % of and 14 % for the and , respectively. The compensation level itself is of minor importance for the cell performance. Instead, the simulations indicate that the observed behavior in the temperature coefficients of the solar cells is mostly explained by differences in the net doping and carrier lifetime of the wafers.