The critical doping levels in cuprates, where the ground state changes its nature (from an antiferromagnet to a spin glass to superconductor to metal), are not universal. We investigate the origin of these critical doping variations by measuring the in-plane oxygen pσ hole density in the CuO2 layers as a function of the oxygen density y in (CaxLa1−x)(Ba1.75−xLa0.25+x)Cu3Oy. This is done using the oxygen 17 nuclear quadrupole resonance parameter νQ. We compare compounds with x = 0.1 and 0.4 which have significant critical y variations and find that these variations can be explained by a change in the efficiency of hole injection into the pσ orbital. This allows us to generate a unified phase diagram for the CLBLCO system across the entire doping range, with no adjustable parameters.There are several critical doping levels in the phase diagram of the cuprates where the ground state changes [1]. The first critical doping level is when the long range antiferromagnetic (AFM) order is destroyed and replaced by a spin glass (SG) state; next superconductivity (SC) emerges; then the spin glass is destroyed; and finally, superconductivity is destroyed and replaced by a metallic state. These critical levels exist in the phase diagram of all cuprates which can be doped over a wide range such as La 2−x Sr x CuO 4 (LSCO) and YBa 2 Cu 3 O y (YBCO), but they vary between compounds. Several attempts have been made to construct a universal phase diagram but thus far only partial diagrams, of only one or two phases, have been achieved [2][3][4][5][6]. One particular example is the phase diagram of the (Ca x La 1−x )(Ba 1.75−x La 0.25+x )Cu 3 O y (CLBLCO) system shown in Fig. 1(a), which includes four different families with x = 0.1, 0.2, 0.3 and 0.4 [7]. This phase diagram clearly demonstrates that the critical oxygen densities y depend on x and thus are not universal.The reason for lack of universality is not clear and could be one of many. For example, it is possible that the doping efficiency of the CuO 2 planes is family-dependent. A second option is interlayer coupling, which in CLBLCO is x dependent [7]; it is conceivable that the interlayer coupling determines the critical doping. Another possibility is that two different kinds of holes are formed in the CuO 2 planes, and only the "mobile holes" participate in the SC mechanism; perhaps the level of mobility varies between families [9,10]. Finally, in the t−J model the critical doping where the AFM order is destroyed depends on t/J [11]; it could be that t/J varies between CLBLCO families. In this work we investigate the origin of the critical doping level variation between different CLBLCO families by directly measuring the hole density in the CuO 2 plane of CLBLCO using the oxygen Nuclear Quadrupole Resonance (NQR) parameter 17 ν Q . This parameter is extracted from Nuclear Magnetic Resonance (NMR) experiments and is directly related to the density of holes in the in-plane oxygen p σ orbital as we demon-